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DOI :
10.3791/62015-v
•
7:24 min
May 10th, 2021
Chapters
0:04
Introduction
0:59
Transmission Electron Microscopy (TEM) Alignment for Beam-Rocking
2:36
Incident Beam Collimation and Pivot Point Setup
3:47
Electron-Channeling Pattern (ECP) Acquisition
4:30
Energy-Dispersive X-Ray Analysis
5:10
Results: Representative ECP and ICP Emission Imaging
6:46
Conclusion
利用事件电子束摇动条件下的电子导引现象,可靠地从少数民族物种、光元素、缺氧和其他点/线/平面缺陷中提取信息,为估计杂质的现场占用及其化学状态提供了定量微分析方法的总大纲。
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