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DOI :
10.3791/62015-v
•
7:24 min
May 10th, 2021
Chapters
0:04
Introduction
0:59
Transmission Electron Microscopy (TEM) Alignment for Beam-Rocking
2:36
Incident Beam Collimation and Pivot Point Setup
3:47
Electron-Channeling Pattern (ECP) Acquisition
4:30
Energy-Dispersive X-Ray Analysis
5:10
Results: Representative ECP and ICP Emission Imaging
6:46
Conclusion
不純物の部位占有量を推定する定量的微分分析法の概要を、少数種、光元素、酸素空孔、その他の点線/平面欠陥から確実に抽出する電子ビーム揺動条件下での電子チャネリング現象を利用して提供します。
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