Masashi Kato

Masashi Kato

Department of Electrical & Mechanical Engineering, Nagoya Institute of Technology

Affiliated withNagoya Institute of Technology

Research Area

EngineeringUnit 1

Biography

JoVE Journal Publications

ArticleTotal : 1
Year
Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Publication title
2019

Other Publications

Article
Year
Risk Assessment of Neonatal Exposure to Low Frequency Noise Based on Balance in Mice.

Frontiers in behavioral neuroscience| PubMed ID: 28275341

2017
2017
2018