Dianne L. Poster

Mary Kombolias¹, 

Jan Obrzut², 

Michael T. Postek^3,4, 

Dianne L. Poster², 

Yaw S. Obeng³ 

¹Testing and Technical Services, Plant Operations, United States Government Publishing Office, 

²Materials Measurement Laboratory, National Institute of Standards and Technology, 

³Nanoscale Device Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology, 

⁴College of Pharmacy, University of South Florida