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Federal Institute for Material Research and Testing (BAM)

1 ARTICLES PUBLISHED IN JoVE

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Chemistry

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
Francesca Bennet 1, Anja Müller 1, Jörg Radnik 1, Yves Hachenberger 2, Harald Jungnickel 2, Peter Laux 2, Andreas Luch 2, Jutta Tentschert 2
1Division of Surface Analysis and Interfacial Chemistry, Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety, German Federal Institute for Risk Assessment (BfR)

A number of different procedures for preparing nanoparticles for surface analysis are presented (drop casting, spin coating, deposition from powders, and cryofixation). We discuss the challenges, opportunities, and possible applications of each method, particularly regarding the changes in the surface properties caused by the different preparation methods.

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