screening-coatings-for-an-all-solid-state-battery-using-situ

Screening of Coatings for an All-Solid-State Battery Using <em>In Situ</em> Transmission Electron Microscopy

With the ever-increasing use of Li-ion batteries, especially due to their adoption in electric vehicles, their safety is in prime focus. Thus, the ...

Forschungszentrum Jülich GmbH

Novel caustic phenomena, which contain fold, butterfly and elliptic umbilic catastrophes, are observed in defocused images of two approximately collinear oppositely biased metallic tips in a transmission electron microscope. The observed patterns depend sensitively on defocus, on the applied voltage between the tips and on their separation and lateral offset. Their main features are interpreted on the basis of a projected electrostatic potential model for the electron-optical phase shift. 

Tunable caustic phenomena in electron wavefields.

In order to obtain a fundamental understanding of the interplay between charge, spin, orbital and lattice degrees of freedom in magnetic materials and to predict and control their physical properties, experimental techniques are required that are capable of accessing local magnetic information with atomic-scale spatial resolution. Here, we show that a combination of electron energy-loss magnetic chiral dichroism  and chromatic-aberration-corrected transmission electron microscopy, which reduces the focal spread of inelastically scattered electrons by orders of magnitude when compared with the use of spherical aberration correction alone, can achieve atomic-scale imaging of magnetic circular dichroism and provide element-selective orbital and spin magnetic moments atomic plane by atomic plane. This unique capability, which we demonstrate for SrFeMoO, opens the door to local atomic-level studies of spin configurations in a multitude of materials that exhibit different types of magnetic coupling, thereby contributing to a detailed understanding of the physical origins of magnetic properties of materials at the highest spatial resolution.

Atomic scale imaging of magnetic circular dichroism by achromatic electron microscopy.

In Fig. 1 of the version of this Letter originally published, the word 'Subtract' was missing from the green box to the left of panel f. This has now been corrected in all versions of the Letter.

Publisher Correction: Atomic scale imaging of magnetic circular dichroism by achromatic electron microscopy.

A novel device that can be used as a tunable support-free phase plate for transmission electron microscopy of weakly scattering specimens is described. The device relies on the generation of a controlled phase shift by the magnetic field of a segment of current-carrying wire that is oriented parallel or antiparallel to the electron beam. The validity of the concept is established using both experimental electron holographic measurements and a theoretical model based on Ampere's law. Computer simulations are used to illustrate the resulting contrast enhancement for studies of biological cells and macromolecules.

Tunable Ampere phase plate for low dose imaging of biomolecular complexes.

The key features of quantum mechanics are vividly illustrated by the Young-Feynman two-slit thought experiment, whose second part discusses the recording of an electron distribution with one of the two slits partially or totally closed by an aperture. Here, we realize the original Feynman proposal in a modern electron microscope equipped with a high brightness gun and two biprisms, with one of the biprisms used as a mask. By exciting the microscope lenses to conjugate the biprism plane with the slit plane, observations are carried out in the Fraunhofer plane with nearly ideal control of the covering of one of the slits. A second, new experiment is also presented, in which interference phenomena due to partial overlap of the slits are observed in the image plane. This condition is obtained by inserting the second biprism between the two slits and the first biprism and by biasing it in order to overlap their images.

The Young-Feynman controlled double-slit electron interference experiment.

The orbital angular momentum (OAM) sorter is an electron optical device for the measurement of an electron's OAM. It is based on two phase elements, which are referred to as an "unwrapper" and a "corrector" and are located in Fourier conjugate planes. The simplest implementation of the sorter is based on electrostatic phase elements, such as a charged needle for the unwrapper and electrodes with alternating charges or potentials for the corrector. Here, we use a formal analogy between phase shifts introduced by charges and vertical currents to propose alternative designs for the sorter elements, which are based on phase shifts introduced by magnetic fields. We use this concept to provide a general guide for phase element design, which promises to provide improved reliability of phase control in electron optics.

A sorter for electrons based on magnetic elements.

Conformal coating of silicon (Si) anode particles is a common strategy for improving their mechanical integrity, to mitigate battery capacity fading due to particle volume expansion, which can result in particle crumbling due to lithiation induced strain and excessive solid-electrolyte interface formation. Here, we use  transmission electron microscopy in an open cell to show that TiO coatings on Si/SiO particles undergo thickness dependent rupture on battery cycling where thicker coatings crumble more readily than thinner (∼5 nm) coatings, which corroborates the difference in their capacities.

Amir H. Tavabi

Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons

Forschungszentrum Jülich GmbH

Screening of Coatings for an All-Solid-State Battery Using In Situ Transmission Electron Microscopy

Amir H. Tavabi

.css-o250i3{font-size:18px;font-family:Open Sans,sans-serif;line-height:21.6px;}Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons

Forschungszentrum Jülich GmbH

Screening of Coatings for an All-Solid-State Battery Using In Situ Transmission Electron Microscopy

Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons