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Graduate Institute of Electronics Engineering
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Effect of Focused Ion Beam Imaging on the Crystallinity of InAs.
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Dec, 2015 | Pubmed ID: 26650069
National Taiwan University
Academia Sinica
Chong-Rong Wu1,2,
Tung-Wei Chu2,3,
Kuan-Chao Chen1,2,
Shih-Yen Lin1,2
1Graduate Institute of Electronics Engineering, National Taiwan University,
2Research Center for Applied Sciences, Academia Sinica,
3Graduate Institute of Photonics and Optoelectronics, National Taiwan University
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