quantitative-atomic-site-analysis-functional-dopantspoint-defects

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

A novel elemental and chemical analysis scheme based on electron-channeling phenomena in crystalline materials is introduced, where the incident ...

Nagoya University

The occupation sites and the occupancies of trace dopants in La/Co co-doped Sr-M-type ferrite, SrFe12O19, were quantitatively and precisely determined by beam-rocking energy-dispersive X-ray spectroscopy (EDXS) on the basis of electron-channeling effects. Because the Co atoms, in particular, should be partially substituted for the five crystallographically inequivalent sites, which could be key parameters in improving the magneto-crystalline anisotropy, it is difficult yet intriguing to discover their occupation sites and occupancies without using the methods of large-scale facilities, such as neutron diffraction and synchrotron radiation. In the present study, we tackled this problem by applying an extended statistical atom location by channeling enhanced microanalysis method, using conventional transmission electron microscopy, EDXS and dynamical electron elastic/inelastic scattering theories. The results show that the key occupation sites of Co were the 2a, 4f1 and 12k sites. The quantified occupancies of Co were consistent with those of the previous study, which involved a combination of neutron diffraction and extended X-ray absorption fine structure analysis, as well as energetics considerations based on by first-principles calculations.

Quantitative determination of occupation sites of trace Co substituted for multiple Fe sites in M-type hexagonal ferrite using statistical beam-rocking TEM-EDXS analysis.

This paper demonstrates how Signal Subspace Sampling (SSS) is an effective pre-processing step for Non-negative Matrix Factorization (NMF) or Vertex Component Analysis (VCA). The approach allows to uniquely extract non-negative source signals which are orthogonal in at least one observation channel, respectively. It is thus well suited for processing hyperspectral images from X-ray microscopy, or other emission spectroscopies, into its non-negative source components. The key idea is to resample the given data so as to satisfy better the necessity and sufficiency conditions for the subsequent NMF or VCA. Results obtained both on an artificial simulation study as well as based on experimental data from electron-microscopy are reported.

Unmixing hyperspectral data by using signal subspace sampling.

We propose a magnetic measurement method utilizing a patterned postsample aperture in a transmission electron microscope. While utilizing electron magnetic circular dichroism, the method circumvents previous needs to shape the electron probe to an electron vortex beam or astigmatic beam. The method can be implemented in standard scanning transmission electron microscopes by replacing the spectrometer entrance aperture with a specially shaped aperture, hereafter called a ventilator aperture. The proposed setup is expected to work across the whole range of beam sizes-from wide parallel beams down to atomic resolution magnetic spectrum imaging.

Masahiro Ohtsuka

Electron Nanoscopy Division,
Advanced Measurement Technology Center,
Institute of Materials & Systems for Sustainability,
Electron Nanoscopy Division, Advanced Measurement Technology Center, Institute of Materials & Systems for Sustainability

Nagoya University

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis