Joanna Olesiak-Bańska

Institute of Advanced Materials

Wrocław University of Science and Technology

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Wrocław University of Science and Technology

JOVE ARTICLES

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

Maciej Lipok¹,

Patryk Obstarczyk¹,

Joanna Olesiak-Bańska¹

¹Institute of Advanced Materials, Wrocław University of Science and Technology

Chemistry

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