Boise State University

3 ARTICLES PUBLISHED IN JoVE

Engineering

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Olivia O. Maryon^*1, Corey M. Efaw^*1, Frank W. DelRio², Elton Graugnard^1,3, Michael F. Hurley^1,3, Paul H. Davis^1,3

¹Micron School of Materials Science & Engineering, Boise State University, ²Material, Physical, and Chemical Sciences Center, Sandia National Laboratories, ³Center for Advanced Energy Studies

Kelvin probe force microscopy (KPFM) measures surface topography and differences in surface potential, while scanning electron microscopy (SEM) and associated spectroscopies can elucidate surface morphology, composition, crystallinity, and crystallographic orientation. Accordingly, the co-localization of SEM with KPFM can provide insight into the effects of nanoscale composition and surface structure on corrosion.

Engineering

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Audrey C. Parker^*1, Olivia O. Maryon^*1, Mojtaba T. Kaffash², M. Benjamin Jungfleisch², Paul H. Davis^1,3

¹Micron School of Materials Science & Engineering, Boise State University, ²Department of Physics and Astronomy, University of Delaware, ³Center for Advanced Energy Studies

Magnetic force microscopy (MFM) employs a vertically magnetized atomic force microscopy probe to measure sample topography and local magnetic field strength with nanoscale resolution. Optimizing MFM spatial resolution and sensitivity requires balancing decreasing lift height against increasing drive (oscillation) amplitude, and benefits from operating in an inert atmosphere glovebox.

JoVE Core

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Ashton E. Enrriques¹, Sean Howard², Raju Timsina³, Nawal K. Khadka³, Amber N. Hoover⁴, Allison E. Ray⁵, Ling Ding⁴, Chioma Onwumelu⁶, Stephan Nordeng⁶, Laxman Mainali^3,7, Gunes Uzer², Paul H. Davis^1,8

¹Micron School of Materials Science & Engineering, Boise State University, ²Department of Mechanical & Biomedical Engineering, Boise State University, ³Department of Physics, Boise State University, ⁴Energy and Environmental Science and Technology, Idaho National Laboratory, ⁵Science and Technology, Idaho National Laboratory, ⁶Harold Hamm School of Geology & Geological Engineering, University of North Dakota, ⁷Biomolecular Sciences Graduate Program, Boise State University, ⁸Center for Advanced Energy Studies

Quantifying the contact area and force applied by an atomic force microscope (AFM) probe tip to a sample surface enables nanoscale mechanical property determination. Best practices to implement AFM cantilever-based nanoindentation in air or fluid on soft and hard samples to measure elastic modulus or other nanomechanical properties are discussed.