June 27th, 2022
•Kelvin probe force microscopy (KPFM) measures surface topography and differences in surface potential, while scanning electron microscopy (SEM) and associated spectroscopies can elucidate surface morphology, composition, crystallinity, and crystallographic orientation. Accordingly, the co-localization of SEM with KPFM can provide insight into the effects of nanoscale composition and surface structure on corrosion.
Related Videos
Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
Preparation and Friction Force Microscopy Measurements of Immiscible, Opposing Polymer Brushes
Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Microfluidic Imaging Flow Cytometry by Asymmetric-detection Time-stretch Optical Microscopy (ATOM)
Fabrication of Polymer Microspheres for Optical Resonator and Laser Applications
Determining Tribocorrosion Rate and Wear-Corrosion Synergy of Bulk and Thin Film Aluminum Alloys
In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Copyright © 2024 MyJoVE Corporation. 판권 소유