Name: probing c84-embedded si substrate using scanning probe microscopy and molecular dynamics
Uploaded: 2016-09-28T12:30:00.000+00:00
Duration: 13 min 58 s
Description: Watch this Scientific Journal Video about Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics at JoVE.com

The authors would like to thank the Ministry of Science and Technology of Taiwan, for their financial support of this research under Contract Nos. MOST-102-2923-E-492- 001-MY3 (W. J. Lee) and NSC-102- 2112-M-005-003-MY3 (M. S. Ho). Support from the High-performance Computing of Taiwan in providing huge computing resources to facilitate this research is also gratefully acknowledged.

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저자는 공개 아무것도 없어.

<html> 본 연구에서는 (도 1) 신규 어닐링 공정을 통해 실리콘 기판 상에 C (84)의 자기 조립 단분자막의 제조를 보여준다. 이 프로세스는 나노 매립 반도체 기판의 다른 종류를 제조 할 수있다. 은 C (84)는 Si 기판은 UHV-STM (도 2), 전계 방출 분광기, 광 발광 스펙트럼, MFM 및 SQUID (도 3)을 이용하여 원자 수준에서 분석되었다 - 임베디드. <p class="jove_...

풀러렌 분자와 그들의 우수한 구조적 특성, 전기 전도성, 기계적 강도, 화학적 특성 1-4 그들은 나노 물질 중 독특한입니다 구성하는 복합 재료. 이들 재료는 전자, 컴퓨터, 연료 전지 기술은 태양 전지, 및 전계 방출 기술 5,6- 같은 분야의 범위에서 매우 유익 입증되었다. 이들 재료 중에서, 실리콘 카바이드 (SiC) 나노 입자 복합체는 넓은 밴드 갭, 높은 열 전도성과 안정성, 높은 전기 브레이크 능력, 및 화학적 불활성 특히주의 덕분 받았다. 이러한 이점은 광전자 장치에 특히 명백하며, 금속 - 산화물 - 반도체 전계 효과 트랜지스터 (MOSFET), 발광 다이오드 (LED)와 고출력, 고주파, 고온 응용. 그러나, 고밀도 결함은 일반적 conventi 표면 관찰도 그러 탄화 규소 심지어 장치 고장 7,8 선도 전자 구조에 악영향을 가질 수있다. SiC로 애플리케이션이 1960 년부터 연구되어 있다는 사실에도 불구하고, 이러한 특정 미해결 문제가 남아있다. 이 연구의 목적은 C (84)의 제조가 생성 된 물질의 전자 광전자, 기계, 자기, 현장 방출 특성의 포괄적 인 이해를 얻기 위해 Si 기판의 이종 접합 및 후속 분석 - 임베디드이었다. 또한, 분자 역학 계산의 새로운 애플리케이션을 통해, 나노 물질의 특성을 예측하는 수치 시뮬레이션을 이용하여 문제를 해결.

<table><tbody><tr><td>Silicon wafer</td><td></td><td></td><td>Si(111). Type/Dopant: P/Boron; Resistivity: 0.05-0.1 Ohm&amp;#183;cm</td></tr><tr><td>Carbon, C&lt;sub&gt;84&lt;/sub&gt;</td><td>Legend Star</td><td></td><td>C&lt;sub&gt;84&lt;/sub&gt; powder, 98%</td></tr><tr><td>Hydrochloric acid</td><td>Sigma-Aldrich</td><td>84422</td><td>RCA, 37%</td></tr><tr><td>Ammonium</td><td>Choneye Pure Chemical</td><td></td><td>RCA, 25%</td></tr><tr><td>Hydrogen peroxide</td><td>Choneye Pure Chemical</td><td></td><td>RCA, 35%</td></tr><tr><td>Nitrogen</td><td>Ni Ni Air</td><td></td><td>high-pressure bottle, 95%</td></tr><tr><td>Tungsten</td><td>Nilaco</td><td>461327</td><td>wire, diameter 0.3 mm, tip</td></tr><tr><td>Sodium hydroxide</td><td>UCW</td><td>85765</td><td>etching Tungsten wire for tip</td></tr><tr><td>Acetone</td><td>Marcon Fine Chemicals</td><td>99920</td><td>suitable for liquid chromatography and UV-spectrophotometry</td></tr><tr><td>Methanol</td><td>Marcon Fine Chemicals</td><td>64837</td><td>suitable for liquid chromatography and UV-spectrophotometry</td></tr><tr><td>UHV-SPM</td><td>JEOL Ltd</td><td>JSPM-4500A</td><td>Ultrahigh Vacuum Scanning Tunneling Microscope and Ultrahigh Vacuum Atomic Force Microscope</td></tr><tr><td>Power supply</td><td>Keithley</td><td>237</td><td>High-Voltage Source-Measure Unit</td></tr><tr><td>SQUID</td><td>Quantum desigh</td><td>MPMS-7</td><td>Magnetic field strength: &amp;plusmn;7.0 Tesla, Temperature range: 2&amp;#8211;400 K, Magnetic-dipole range: 5&amp;nbsp;&amp;times;&amp;nbsp;10&lt;sup&gt;-7&lt;/sup&gt; &amp;#8211; 300 emu</td></tr><tr><td>ALPS</td><td>National Center for High-performance Computing, Taiwan</td><td></td><td>Advanced Large-scale Parallel Supercluster, 177Tflops; 25,600 CPU cores; 73,728 GB RAM; 1,074 TB storage</td></tr></tbody></table>

probing c84-embedded si substrate using scanning probe microscopy and molecular dynamics

이 논문은 어레이 디자인 C (84)의 Si 기판 - 임베디드은 초고 진공 챔버 내에 제어 된 자기 조립 방법을 이용하여 제조보고한다. 은 C (84)의 특징은, 이러한 원자 해상도 지형 상태 로컬 전자 밀도, 밴드 갭 에너지, 전계 방출 특성, 나노 기계 강성, 표면 자력으로, 실리콘 표면 - 임베디드 울트라 하에서 표면 분석하는 다양한 기술을 이용하여 조사 하였다 높은 진공 (UHV) 조건뿐만 아니라에서 대기 시스템. 실험 결과는 C (84)의 높은 균일 성 실리콘 표면이 제어 된 자기 조립 나노 메커니즘을 사용하여, 절삭 공구, 전계 방출 디스플레이 (FED), 광전자 소자 제조, MEMS의 응용에서 중요한 발전을 나타낸다하여 제조 - 임베디드 및 노력 입증 카바이드 반도체에 적합한 교체를 찾을 수 있습니다. 반 경험적 잠재력을 가진 분자 역학 (MD) 방법은 수 bC (84)의 나노 압입을 연구하는 데 전자는 Si 기판을 - 임베디드. MD 시뮬레이션을 수행하기위한 상세한 설명은 여기에 제공된다. 들여 쓰기의 힘, 탄성 계수, 표면 강도, 원자 스트레스, 원자 변형 등의 MD 시뮬레이션의 기계적 분석에 대한 종합적인 연구를위한 세부 사항이 포함되어 있습니다. 압입 모델의 원자 스트레스 - 폰 미제스 응력 분포는 원자 적 레벨 시간 평가를 변형 메커니즘을 모니터링하도록 계산 될 수있다.

. 무질서의 Si (111) 표면에 C 84 분자의 단일 층 1 그림 A UHV 챔버에서 제어 된 자기 조립 공정을 이용하여 제조 따르면 다양한 정도에 UHV-STM 측정 지형 일련의 이미지를 도시 하였다 : (a) 0.01 ㎖, (b) 0.2 ㎖, (c) 0.7 ㎖, 및 (d) 0.9 ML. 84은 C 매립 Si 기판의 전기 광학적 특성은 또한 STM 및 PL (도 2) 등의 표면 분석 기술의 다양한 사용하여 조사 하였다. 결과 샘플의 우수...

Watch this Scientific Journal Video about Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics at JoVE.com

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

C 프로빙<sub&gt; (84)</sub&gt;은 스캐닝 프로브 현미경 및 분자 역학을 사용하여 실리콘 기판을 - 임베디드

This paper reports an array-designed C84-embedded Si substrate fabricated using a controlled self-assembly method in an ultra-high vacuum chamber. The ...

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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

11.7K 조회수.  National Chung Hsing University. This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

비디오: Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Scanning-probe Single-electron Capacitance Spectroscopy

The integration of low-temperature scanning-probe techniques and single-electron capacitance spectroscopy represents a powerful tool to study the electronic quantum structure of small systems - including individual atomic dopants in semiconductors. Here we present a capacitance-based method, known as Subsurface Charge Accumulation (SCA) imaging, which is capable of resolving single-electron charging while achieving sufficient spatial resolution to image individual atomic dopants. The use of a capacitance technique enables observation of subsurface features, such as dopants buried many nanometers beneath the surface of a semiconductor material1,2,3. In principle, this technique can be applied to any system to resolve electron motion below an insulating surface.
As in other electric-field-sensitive scanned-probe techniques4, the lateral spatial resolution of the measurement depends in part on the radius of curvature of the probe tip. Using tips with a small radius of curvature can enable spatial resolution of a few tens of nanometers. This fine spatial resolution allows investigations of small numbers (down to one) of subsurface dopants1,2. The charge resolution depends greatly on the sensitivity of the charge detection circuitry; using high electron mobility transistors (HEMT) in such circuits at cryogenic temperatures enables a sensitivity of approximately 0.01 electrons/Hz&frac12; at 0.3 K 5.

Scanning-probe single-electron capacitance spectroscopy facilitates the study of single-electron motion in localized subsurface regions. A sensitive charge-detection circuit is incorporated into a cryogenic scanning probe microscope to investigate small systems of dopant atoms beneath the surface of semiconductor samples.

스캐닝 프로브 단일 전자 용량 분광학

The integration of low-temperature scanning-probe techniques and single-electron capacitance spectroscopy represents a powerful tool to study the ...

연구

공학

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Atomic force spectroscopy is an ideal tool to study molecules at surfaces and interfaces. An experimental protocol to couple a large variety of single molecules covalently onto an AFM tip is presented. At the same time the AFM tip is passivated to prevent unspecific interactions between the tip and the substrate, which is a prerequisite to study single molecules attached to the AFM tip. Analyses to determine the adhesion force, the adhesion length, and the free energy of these molecules on solid surfaces and bio-interfaces are shortly presented and external references for further reading are provided. Example molecules are the poly(amino acid) polytyrosine, the graft polymer PI-g-PS and the phospholipid POPE (1-palmitoyl-2-oleoyl-sn-glycero-3-phosphoethanolamine). These molecules are desorbed from different surfaces like CH3-SAMs, hydrogen terminated diamond and supported lipid bilayers under various solvent conditions. Finally, the advantages of force spectroscopic single molecule experiments are discussed including means to decide if truly a single molecule has been studied in the experiment.

A protocol to couple a large variety of single molecules covalently onto an AFM tip is presented. Procedures and examples to determine the adhesion force and free energy of these molecules on solid supports and bio-interfaces are provided.

원자 힘 분광학에 의해 단일 ​​분자 접착 조사

Atomic force spectroscopy is an ideal tool to study molecules at surfaces and interfaces. An experimental protocol to couple a large variety of single ...

Hand Controlled Manipulation of Single Molecules via a Scanning Probe Microscope with a 3D Virtual Reality Interface

Considering organic molecules as the functional building blocks of future nanoscale technology, the question of how to arrange and assemble such building blocks in a bottom-up approach is still open. The scanning probe microscope (SPM) could be a tool of choice; however, SPM-based manipulation was until recently limited to two dimensions (2D). Binding the SPM tip to a molecule at a well-defined position opens an opportunity of controlled manipulation in 3D space. Unfortunately, 3D manipulation is largely incompatible with the typical 2D-paradigm of viewing and generating SPM data on a computer. For intuitive and efficient manipulation we therefore couple a low-temperature non-contact atomic force/scanning tunneling microscope (LT NC-AFM/STM) to a motion capture system and fully immersive virtual reality goggles. This setup permits &#34;hand controlled manipulation&#34; (HCM), in which the SPM tip is moved according to the motion of the experimenter&#39;s hand, while the tip trajectories as well as the response of the SPM junction are visualized in 3D. HCM paves the way to the development of complex manipulation protocols, potentially leading to a better fundamental understanding of nanoscale interactions acting between molecules on surfaces. Here we describe the setup and the steps needed to achieve successful hand-controlled molecular manipulation within the virtual reality environment.

We demonstrate the precise manipulation of individual organic molecules on a metal surface with the tip of a scanning probe microscope driven in 3D by the experimenter's hand using a motion capture system and fully immersive virtual reality goggles.

손 3D 가상 현실 인터페이스와 스캐닝 프로브 현미경을 통해 단일 분자의 조작을 제어

Considering organic molecules as the functional building blocks of future nanoscale technology, the question of how to arrange and assemble such building ...

Probing The Structure And Dynamics Of Nucleosomes Using Atomic Force Microscopy Imaging

Chromatin, which is a long chain of nucleosome subunits, is a dynamic system that allows for such critical processes as DNA replication and transcription to take place in eukaryotic cells. The dynamics of nucleosomes provides access to the DNA by replication and transcription machineries, and critically contributes to the molecular mechanisms underlying chromatin functions. Single-molecule studies such as atomic force microscopy (AFM) imaging have contributed significantly to our current understanding of the role of nucleosome structure and dynamics. The current protocol describes the steps enabling high-resolution AFM imaging techniques to study the structural and dynamic properties of nucleosomes. The protocol is illustrated by AFM data obtained for the centromere nucleosomes in which H3 histone is replaced with its counterpart centromere protein A (CENP-A). The protocol starts with the assembly of mono-nucleosomes using a continuous dilution method. The preparation of the mica substrate functionalized with aminopropyl silatrane (APS-mica) that is used for the nucleosome imaging is critical for the AFM visualization of nucleosomes described and the procedure to prepare the substrate is provided. Nucleosomes deposited on the APS-mica surface are first imaged using static AFM, which captures a snapshot of the nucleosome population. From analyses of these images, such parameters as the size of DNA wrapped around the nucleosomes can be measured and this process is also detailed. The time-lapse AFM imaging procedure in the liquid is described for the high-speed time-lapse AFM that can capture several frames of nucleosome dynamics per second. Finally, the analysis of nucleosome dynamics enabling the quantitative characterization of the dynamic processes is described and illustrated.

Here, we present a protocol to characterize nucleosome particles at the single-molecule level using static and time-lapse atomic force microscopy (AFM) imaging techniques. The surface functionalization method described allows for the capture of the structure and dynamics of nucleosomes in high-resolution at the nanoscale.

구조와 원자 힘 현미경 이미징 사용 하 여 Nucleosomes의 역학 조사

Chromatin, which is a long chain of nucleosome subunits, is a dynamic system that allows for such critical processes as DNA replication and transcription ...

생화학

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

Electrically assisted deformation (EAD) is increasingly being used to improve the formability of metals during processes such as sheet metal rolling and forging. Adoption of this technique is proceeding despite disagreement concerning the underlying mechanism responsible for EAD. The experimental procedure described herein enables a more explicit study compared to previous EAD research by removing thermal effects, which are responsible for disagreement in interpreting previous EAD results. Furthermore, as the procedure described here enables EAD observation in situ and in real time in a transmission electron microscope (TEM), it is superior to existing post-mortem methods that observe EAD effects post-test. Test samples consist of a single crystal copper (SCC) foil having a free-standing tensile test section of nanoscale thickness, fabricated using a combination of laser and ion beam milling. The SCC is mounted to an etched silicon base that provides mechanical support and electrical isolation while serving as a heat sink. Using this geometry, even at high current density (~3,500 A/mm2), the test section experiences a negligible temperature increase (&#60;0.02 &#176;C), thus eliminating Joule heating effects. Monitoring material deformation and identifying the corresponding changes to microstructures, e.g. dislocations, are accomplished by acquiring and analyzing a series of TEM images. Our sample preparation and in situ experiment procedures are robust and versatile as they can be readily utilized to test materials with different microstructures, e.g., single and polycrystalline copper.

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

Isolating electrical and thermal effects on electrically assisted deformation (EAD) is very difficult using macroscopic samples. Metallic sample micro- and nanostructures together with a custom test procedure have been developed to evaluate the impact of applied current on the formation without joule heating and evolution of dislocations on these samples.

에 대한 소설 방법<em&gt; 현장에서</em&gt; 나노 크기 시편의 전자 기계적 특성 분석

Electrically assisted deformation (EAD) is increasingly being used to improve the formability of metals during processes such as sheet metal rolling and ...

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

The miniaturization of semiconductor devices to scales where small numbers of dopants can control device properties requires the development of new techniques capable of characterizing their dynamics. Investigating single dopants requires sub-nanometer spatial resolution, which motivates the use of scanning tunneling microscopy (STM). However, conventional STM is limited to millisecond temporal resolution. Several methods have been developed to overcome this shortcoming, including all-electronic time-resolved STM, which is used in this study to examine dopant dynamics in silicon with nanosecond resolution. The methods presented here are widely accessible and allow for local measurement of a wide variety of dynamics at the atomic scale. A novel time-resolved scanning tunneling spectroscopy technique is presented and used to efficiently search for dynamics.

We demonstrate an all-electronic method to observe nanosecond-resolved charge dynamics of dopant atoms in silicon with a scanning tunneling microscope.

모든 전자 나노초 해결 주사 터널링 현미경: 촉진 단일 불순물 충전 역학 조사

The miniaturization of semiconductor devices to scales where small numbers of dopants can control device properties requires the development of new ...

Characterizing Individual Protein Aggregates by Infrared Nanospectroscopy and Atomic Force Microscopy

The phenomenon of protein misfolding and aggregation results in the formation of highly heterogeneous protein aggregates, which are associated with neurodegenerative conditions such as Alzheimer&#8217;s and Parkinson&#8217;s diseases. In particular low molecular weight aggregates, amyloid oligomers, have been shown to possess generic cytotoxic properties and are implicated as neurotoxins in many forms of dementia. We illustrate the use of methods based on atomic force microscopy (AFM) to address the challenging task of characterizing the morphological, structural and chemical properties of these aggregates, which are difficult to study using conventional structural methods or bulk biophysical methods because of their heterogeneity and transient nature. Scanning probe microscopy approaches are now capable of investigating the morphology of amyloid aggregates with sub-nanometer resolution. We show here that infrared (IR) nanospectroscopy (AFM-IR), which simultaneously exploits the high resolution of AFM and the chemical recognition power of IR spectroscopy, can go further and enable the characterization of the structural properties of individual protein aggregates, and thus offer insights into the aggregation mechanisms. Since the approach that we describe can be applied also to the investigations of the interactions of protein assemblies with small molecules and antibodies, it can deliver fundamental information to develop new therapeutic compounds to diagnose or treat neurodegenerative disorders.

We describe the application of infrared nanospectroscopy and high-resolution atomic force microscopy to visualize the process of protein self-assembly into oligomeric aggregates and amyloid fibrils, which is closely associated with the onset and development of a wide range of human neurodegenerative disorders.

적외선 나노 스펙트로펙트 및 원자력 현미경으로 개별 단백질 응집체 특성화

The phenomenon of protein misfolding and aggregation results in the formation of highly heterogeneous protein aggregates, which are associated with ...

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Scanning electrochemical microscopy (SECM) is used to measure the local electrochemical behavior of liquid/solid, liquid/gas and liquid/liquid interfaces. Atomic force microscopy (AFM) is a versatile tool to characterize micro- and nanostructure in terms of topography and mechanical properties. However, conventional SECM or AFM provides limited laterally resolved information on electrical or electrochemical properties at nanoscale. For instance, the activity of a nanomaterial surface at crystal facet levels is difficult to resolve by conventional electrochemistry methods. This paper reports the application of a combination of AFM and SECM, namely, AFM-SECM, to probe nanoscale surface electrochemical activity while acquiring high-resolution topographical data. Such measurements are critical to understanding the relationship between nanostructure and reaction activity, which is relevant to a wide range of applications in material science, life science and chemical processes. The versatility of the combined AFM-SECM is demonstrated by mapping topographical and electrochemical properties of faceted nanoparticles (NPs) and nanobubbles (NBs), respectively. Compared to previously reported SECM imaging of nanostructures, this AFM-SECM enables quantitative assessment of local surface activity or reactivity with higher resolution of surface mapping.

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM

Atomic force microscopy (AFM) combined with scanning electrochemical microscopy (SECM), namely, AFM-SECM, can be used to simultaneously acquire high-resolution topographical and electrochemical information on material surfaces at nanoscale. Such information is critical to understanding heterogeneous properties (e.g., reactivity, defects, and reaction sites) on local surfaces of nanomaterials, electrodes and biomaterials.

하이브리드 원자력 현미경 -스캐닝 전기 화학 현미경 (AFM-SECM)을 사용하여 나노 물질의 표면 전기 화학 활성을 조사

Scanning electrochemical microscopy (SECM) is used to measure the local electrochemical behavior of liquid/solid, liquid/gas and liquid/liquid interfaces. ...

화학

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

On-surface synthesis has recently been regarded as a promising approach for the generation of new molecular structures. It has been particularly successful in the synthesis of graphene nanoribbons, nanographenes and intrinsically reactive and instable, yet attractive species. It is based on the combination of solution chemistry aimed at preparation of appropriate molecular precursors for further ultra-high vacuum surface assisted transformations. This approach also owes its success to an incredible development of characterization techniques, such as scanning tunneling/atomic force microscopy and related methods, which allow detailed, local characterization at atomic scale. While the surface-assisted synthesis can provide molecular nanostructures with outstanding precision, down to single atoms, it suffers from basing on metallic surfaces and often limited yield. Therefore, the extension of the approach away from metals and the struggle to increase productivity seem to be significant challenges toward wider applications. Herein, we demonstrate the on-surface synthesis approach for generation of non-planar nanographenes, which are synthesized through a combination of solution chemistry and sequential surface-assisted processes, together with the detailed characterization by scanning probe microscopy methods.

<meta charset="utf8"></head><body>용액과 표면 화학의 조합을 통해 합성된 다공성 nanographenes의 현미경 시각화

A combination of solution and surface assisted synthesis opens new directions in the atomically precise synthesis of nanostructures. Scanning tunneling microscopy (STM) supplemented by non-contact atomic force microscopy (nc-AFM) enables detailed characterization of newly designed and generated carbon-based nano-objects.

C 프로빙

요약

더 많은 비디오 탐색

이 비디오의 챕터

스캐닝 프로브 단일 전자 용량 분광학

원자 힘 분광학에 의해 단일 분자 접착 조사

손 3D 가상 현실 인터페이스와 스캐닝 프로브 현미경을 통해 단일 분자의 조작을 제어

구조와 원자 힘 현미경 이미징 사용 하 여 Nucleosomes의 역학 조사

에 대한 소설 방법

모든 전자 나노초 해결 주사 터널링 현미경: 촉진 단일 불순물 충전 역학 조사

적외선 나노 스펙트로펙트 및 원자력 현미경으로 개별 단백질 응집체 특성화

하이브리드 원자력 현미경 -스캐닝 전기 화학 현미경 (AFM-SECM)을 사용하여 나노 물질의 표면 전기 화학 활성을 조사

용액과 표면 화학의 조합을 통해 합성된 다공성 nanographenes의 현미경 시각화

용액과 표면 화학의 조합을 통해 합성된 다공성 nanographenes의 현미경 시각화

C 프로빙

요약

더 많은 비디오 탐색

이 비디오의 챕터

스캐닝 프로브 단일 전자 용량 분광학

원자 힘 분광학에 의해 단일 ​​분자 접착 조사

손 3D 가상 현실 인터페이스와 스캐닝 프로브 현미경을 통해 단일 분자의 조작을 제어

구조와 원자 힘 현미경 이미징 사용 하 여 Nucleosomes의 역학 조사

에 대한 소설 방법

모든 전자 나노초 해결 주사 터널링 현미경: 촉진 단일 불순물 충전 역학 조사

적외선 나노 스펙트로펙트 및 원자력 현미경으로 개별 단백질 응집체 특성화

하이브리드 원자력 현미경 -스캐닝 전기 화학 현미경 (AFM-SECM)을 사용하여 나노 물질의 표면 전기 화학 활성을 조사

용액과 표면 화학의 조합을 통해 합성된 다공성 nanographenes의 현미경 시각화

용액과 표면 화학의 조합을 통해 합성된 다공성 nanographenes의 현미경 시각화

원자 힘 분광학에 의해 단일 분자 접착 조사