Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

1:29

Single Crystal Surface Preparation for Nuclear Reaction Analysis (NRA) in Ultra-high Vacuum

8:07

Surface Hydrogen Nuclear Reaction Analysis Measurements

9:24

Bulk and Interface Hydrogen Nuclear Reaction Analysis: Preparation and Measurement

11:02

Results: Nuclear Reaction Analysis Hydrogen Depth Profiles for Single Crystal Palladium and from Silicon Dioxide Films on Silicon

12:50

Conclusion