Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
26.4K Views
•
14:11 min
•
March 29th, 2016
DOI :
March 29th, 2016
•Chapters in this video
0:05
Title
1:29
Single Crystal Surface Preparation for Nuclear Reaction Analysis (NRA) in Ultra-high Vacuum
8:07
Surface Hydrogen Nuclear Reaction Analysis Measurements
9:24
Bulk and Interface Hydrogen Nuclear Reaction Analysis: Preparation and Measurement
11:02
Results: Nuclear Reaction Analysis Hydrogen Depth Profiles for Single Crystal Palladium and from Silicon Dioxide Films on Silicon
12:50
Conclusion
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