Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Please note that all translations are automatically generated. Click here for the English version.
10.0K Views
•
08:46 min
•
April 13th, 2016
DOI :
April 13th, 2016
•Rozdziały w tym wideo
0:05
Title
1:28
Steps for Performing Tomography Scans at Beamline 8.3.2 (ALS, LBNL)
4:02
Setting up the Scan Parameters Using the Data Acquisition Computer
4:54
Results: Multi-scale Features Imaged in an Entire Micro-electronic Package Using Synchrotron Radiation Microtomography
6:11
Conclusion
Powiązane Filmy
10:00
Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
11.7K Views
08:11
Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
8.8K Views
08:41
Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution
11.5K Views
08:51
Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
13.1K Views
13:43
Correlative Microscopy for 3D Structural Analysis of Dynamic Interactions
13.9K Views
10:36
Whole Animal Imaging of Drosophila melanogaster using Microcomputed Tomography
4.8K Views
08:04
Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
9.2K Views
09:47
Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy
4.7K Views
14:56
Imaging Replicative Domains in Ultrastructurally Preserved Chromatin by Electron Tomography
3.6K Views
08:55
Cryo-Electron Tomography Remote Data Collection and Subtomogram Averaging
4.7K Views
Copyright © 2025 MyJoVE Corporation. Wszelkie prawa zastrzeżone