Stefan Seelecke

Marvin Schmidt^1,2, 

Johannes Ullrich², 

André Wieczorek³, 

Jan Frenzel³, 

Gunther Eggeler³, 

Andreas Schütze¹, 

Stefan Seelecke² 

¹Lab for Measurement Technology, Saarland University, 

²Intelligent Material Systems Lab, Saarland University, 

³Lab for Material Science, Ruhr Universität Bochum