JoVE Logo

Entrar

Leidos Corporation

1 ARTICLES PUBLISHED IN JoVE

image

Engineering

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Russell C. Reid 1,2, Alberto Piqué 1, Wonmo Kang 1,3
1Materials Science and Technology Division, US Naval Research Laboratory, 2American Society for Engineering Education—Naval Research Laboratory (ASEE-NRL), 3Leidos Corporation

Isolating electrical and thermal effects on electrically assisted deformation (EAD) is very difficult using macroscopic samples. Metallic sample micro- and nanostructures together with a custom test procedure have been developed to evaluate the impact of applied current on the formation without joule heating and evolution of dislocations on these samples.

JoVE Logo

Privacidade

Termos de uso

Políticas

Pesquisa

Educação

SOBRE A JoVE

Copyright © 2024 MyJoVE Corporation. Todos os direitos reservados