Sample Fabrication for Atom Probe Tomography Analysis
5:43
Atom Probe Tomography Analysis in a CAMECA LEAP 3000X HR System
6:31
Reconstruction of Atom Probe Tomography Data
7:13
Results: Elemental Maps and Concentration Depth Profiles of a Grain Boundary
8:38
Conclusion
In this work, we describe the use of the atom-probe tomography technique for studying the grain boundaries of the absorber layer in a CIGS solar cell. A novel approach to prepare the atom probe tips containing the desired grain boundary with a known structure is also presented here.