Kevin R. Coffey

A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples.

Back-etch method for plan view transmission electron microscopy sample preparation of optically opaque films.

A high-throughput approach for cross-sectional transmission electron microscopy sample preparation of thin films.

High contrast hollow-cone dark field transmission electron microscopy for nanocrystalline grain size quantification.

Evidence for learned skill during cocaine self-administration in rats.

Effects of varying reinforcement probability on pavlovian approach behavior and ultrasonic vocalizations in rats.

Crystallographic anisotropy of the resistivity size effect in single crystal tungsten nanowires.