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Yaw S. Obeng

Nanoscale Device Characterization Division,
Physical Measurement Laboratory,
Nanoscale Device Characterization Division, Physical Measurement Laboratory

National Institute of Standards and Technology

BIOGRAPHY

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PUBLICATIONS

Influence of metal-MoS2 interface on MoS2 transistor performance: comparison of Ag and Ti contacts.

ACS applied materials & interfaces Jan, 2015 | Pubmed ID: 25514512

Towards Understanding Early Failures Behavior during Device Burn-In: Broadband RF Monitoring of Atomistic Changes in Materials.

ECS journal of solid state science and technology : JSS , 2016 | Pubmed ID: 27738561

The Influence of Pulsed Electroplating Frequency and Duty Cycle on Copper Film Microstructure and Stress State.

Thin solid films Jan, 2017 | Pubmed ID: 28239200

Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications.

ECS journal of solid state science and technology : JSS , 2017 | Pubmed ID: 29214117

The Impact of Organic Additives on Copper Trench Microstructure.

Journal of the Electrochemical Society , 2017 | Pubmed ID: 29225367

Microwave evaluation of electromigration susceptibility in advanced interconnects.

Journal of applied physics Nov, 2017 | Pubmed ID: 29332950

Generating Multiscale Gold Nanostructures on Glass without Sidewall Deposits Using Minimal Dry Etching Steps.

ACS nano Apr, 2019 | Pubmed ID: 30889351

Dielectric spectroscopic studies of biological material evolution and application to paper.

Tappi journal , 2018 | Pubmed ID: 30983693

Microwave Monitoring of Atmospheric Corrosion of Interconnects.

ECS journal of solid state science and technology : JSS , 2018 | Pubmed ID: 31275732

INSTITUTIONS

National Institute of Standards and Technology

JOVE ARTICLES

Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper

Mary Kombolias¹,

Jan Obrzut²,

Michael T. Postek^3,4,

Dianne L. Poster²,

Yaw S. Obeng³

¹Testing and Technical Services, Plant Operations, United States Government Publishing Office,

²Materials Measurement Laboratory, National Institute of Standards and Technology,

³Nanoscale Device Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology,

⁴College of Pharmacy, University of South Florida

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Yaw S. Obeng

Nanoscale Device Characterization Division,Physical Measurement Laboratory,Nanoscale Device Characterization Division, Physical Measurement Laboratory

National Institute of Standards and Technology

Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper

Nanoscale Device Characterization Division,
Physical Measurement Laboratory,
Nanoscale Device Characterization Division, Physical Measurement Laboratory