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Nanoscale Device Characterization Division,
Physical Measurement Laboratory,
Nanoscale Device Characterization Division, Physical Measurement Laboratory
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Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research.
Scanning Jul-Aug, 2002 | Pubmed ID: 12166805
Nanotip electron gun for the scanning electron microscope.
Scanning May-Jun, 2006 | Pubmed ID: 16878784
Real-time scanning charged-particle microscope image composition with correction of drift.
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Apr, 2011 | Pubmed ID: 21122194
Modeling for accurate dimensional scanning electron microscope metrology: then and now.
Scanning May-Jun, 2011 | Pubmed ID: 21630286
Does your SEM really tell the truth?--How would you know? Part 1.
Scanning Nov-Dec, 2013 | Pubmed ID: 23427011
Does your SEM really tell the truth? How would you know? Part 2.
Scanning May-Jun, 2014 | Pubmed ID: 24166540
Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope.
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 08, 2016 | Pubmed ID: 27452278
X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth Measurement.
Journal of research of the National Institute of Standards and Technology Jul-Aug, 1993 | Pubmed ID: 28053482
Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard Prototype.
Journal of research of the National Institute of Standards and Technology Jul-Aug, 1993 | Pubmed ID: 28053483
Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its Mitigation.
Proceedings of SPIE--the International Society for Optical Engineering , 2015 | Pubmed ID: 28663664
Does Your SEM Really Tell the Truth?-How Would You Know? Part 4: Charging and its Mitigation.
Proceedings of SPIE--the International Society for Optical Engineering , 2015 | Pubmed ID: 28663665
Update on Bio-Refining and Nanocellulose Composite Materials Manufacturing.
Proceedings of SPIE--the International Society for Optical Engineering , 2017 | Pubmed ID: 29225398
Ionizing radiation processing and its potential in advancing biorefining and nanocellulose composite materials manufacturing.
Radiation physics and chemistry (Oxford, England : 1993) Feb, 2018 | Pubmed ID: 29230084
Dielectric spectroscopic studies of biological material evolution and application to paper.
Tappi journal , 2018 | Pubmed ID: 30983693
Innovative Approaches to Combat Healthcare-Associated Infections Using Efficacy Standards Developed Through Industry and Federal Collaboration.
Proceedings of SPIE--the International Society for Optical Engineering , 2018 | Pubmed ID: 31092964
National Institute of Standards and Technology
University of South Florida
Mary Kombolias1,
Jan Obrzut2,
Michael T. Postek3,4,
Dianne L. Poster2,
Yaw S. Obeng3
1Testing and Technical Services, Plant Operations, United States Government Publishing Office,
2Materials Measurement Laboratory, National Institute of Standards and Technology,
3Nanoscale Device Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology,
4College of Pharmacy, University of South Florida
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