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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

11.2K Views

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06:46 min

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August 25th, 2016

DOI :

10.3791/54408-v

August 25th, 2016

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11,191 Views

Norman M. Cao¹, Andrés M. Mier Valdivia², John E. Rice³

¹Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, ²Department of Physics, Massachusetts Institute of Technology, ³Plasma Science and Fusion Center, Massachusetts Institute of Technology

章节

副本

摘要

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Crystal Spectroscopy

Plasma Diagnostics

Ion Temperature

Rotation Velocity

Electron Temperature

Impurity Density

Transport Modeling

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