Oturum Aç

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

11.2K Views

•

06:46 min

•

August 25th, 2016

DOI :

10.3791/54408-v

August 25th, 2016

•

11,191 Views

Norman M. Cao¹, Andrés M. Mier Valdivia², John E. Rice³

¹Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, ²Department of Physics, Massachusetts Institute of Technology, ³Plasma Science and Fusion Center, Massachusetts Institute of Technology

Bölümler

Transkript

Özet

Daha Fazla Video Keşfet

Crystal Spectroscopy

Plasma Diagnostics

Ion Temperature

Rotation Velocity

Electron Temperature

Impurity Density

Transport Modeling

Telif Hakkı © 2020 MyJove Corporation. Tüm hakları saklıdır