Viviana Rodriguez Cardenas

Amanda L. Forster¹, 

Viviana Rodriguez Cardenas¹, 

Ajay Krishnamurthy^1,2, 

Zois Tsinas³, 

Amy Engelbrecht-Wiggans^1,2, 

Nolan Gonzalez¹ 

¹Material Measurement Laboratory, National Institute of Standards and Technology, 

², Theiss Research, 

³, University of Maryland