Michael T. Postek

Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research.

Nanotip electron gun for the scanning electron microscope.

Real-time scanning charged-particle microscope image composition with correction of drift.

Modeling for accurate dimensional scanning electron microscope metrology: then and now.

Does your SEM really tell the truth?--How would you know? Part 1.

Does your SEM really tell the truth? How would you know? Part 2.

Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope.

X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth Measurement.

Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard Prototype.

Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its Mitigation.

Does Your SEM Really Tell the Truth?-How Would You Know? Part 4: Charging and its Mitigation.

Update on Bio-Refining and Nanocellulose Composite Materials Manufacturing.

Ionizing radiation processing and its potential in advancing biorefining and nanocellulose composite materials manufacturing.

Dielectric spectroscopic studies of biological material evolution and application to paper.

Innovative Approaches to Combat Healthcare-Associated Infections Using Efficacy Standards Developed Through Industry and Federal Collaboration.