Gatan Inc.
2 ARTICLES PUBLISHED IN JoVE
Biology
Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Stefano Rubino 1,4, Petter Melin 3, Paul Spellward 2, Klaus Leifer 1
1Department of Engineering Sciences, Uppsala University, 2Gatan Inc., 3Department of Microbiology, Swedish University of Agricultural Sciences, 4Physics Department, University of Oslo
Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.
Immunology and Infection
User-friendly, High-throughput, and Fully Automated Data Acquisition Software for Single-particle Cryo-electron Microscopy
Anil Kumar 1, Surekha P. 1, Sahil Gulati 2, Somnath Dutta 1
1Molecular Biophysics Unit, Indian Institute of Science, 2Gatan Inc.
Single-particle cryo-electron microscopy demands a suitable software package and user-friendly pipeline for high-throughput automatic data acquisition. Here, we present the application of a fully automated image acquisition software package, Latitude-S, and a practical pipeline for data collection of vitrified biomolecules under low-dose conditions.
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