Gatan Inc.

2 ARTICLES PUBLISHED IN JoVE

Biology

Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam

Stefano Rubino^1,4, Petter Melin³, Paul Spellward², Klaus Leifer¹

¹Department of Engineering Sciences, Uppsala University, ²Gatan Inc., ³Department of Microbiology, Swedish University of Agricultural Sciences, ⁴Physics Department, University of Oslo

Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content¹. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.

Immunology and Infection

User-friendly, High-throughput, and Fully Automated Data Acquisition Software for Single-particle Cryo-electron Microscopy

Anil Kumar¹, Surekha P.¹, Sahil Gulati², Somnath Dutta¹

¹Molecular Biophysics Unit, Indian Institute of Science, ²Gatan Inc.

Single-particle cryo-electron microscopy demands a suitable software package and user-friendly pipeline for high-throughput automatic data acquisition. Here, we present the application of a fully automated image acquisition software package, Latitude-S, and a practical pipeline for data collection of vitrified biomolecules under low-dose conditions.