Recherche
Enseignement
Solutions
S'identifier
FR
EN - English
CN - 中文
DE - Deutsch
ES - Español
KR - 한국어
IT - Italiano
FR - Français
PT - Português
TR - Turkish
JA - Japanese
Michigan Center for Materials Characterization
15+ years experience operating scanning electron microscopes, focused ion beam microscopes, transmission electron microscopes, atom probe tomography, optical microscopy and sample preparation.
University of Michigan
Shreya Mahajan1,
Jonah A. Sharkins2,4,
Allen H. Hunter5,
Amir Avishai6,
Evon S. Ereifej2,3,4
1Department of Electrical Engineering and Computer Science, University of Michigan,
2, Veteran Affairs Ann Arbor Healthcare System,
3Department of Neurology, School of Medicine, University of Michigan,
4Department of Biomedical Engineering, University of Michigan,
5Michigan Center for Materials Characterization, University of Michigan,
6, Carl Zeiss SMT, Inc.
Confidentialité
Conditions d'utilisation
Politiques
Contactez-nous
RECOMMANDER À LA BIBLIOTHÈQUE
NEWSLETTERS JoVE
JoVE Journal
Collections de méthodes
JoVE Encyclopedia of Experiments
Archives
JoVE Core
JoVE Business
JoVE Science Education
JoVE Lab Manual
Centre de ressources universitaires
Auteurs
Bibliothécaires
Accès
À PROPOS DE JoVE
Copyright © 2024 MyJoVE Corporation. Tous droits réservés.