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Michigan Center for Materials Characterization
15+ years experience operating scanning electron microscopes, focused ion beam microscopes, transmission electron microscopes, atom probe tomography, optical microscopy and sample preparation.
University of Michigan
Shreya Mahajan1,
Jonah A. Sharkins2,4,
Allen H. Hunter5,
Amir Avishai6,
Evon S. Ereifej2,3,4
1Department of Electrical Engineering and Computer Science, University of Michigan,
2, Veteran Affairs Ann Arbor Healthcare System,
3Department of Neurology, School of Medicine, University of Michigan,
4Department of Biomedical Engineering, University of Michigan,
5Michigan Center for Materials Characterization, University of Michigan,
6, Carl Zeiss SMT, Inc.
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