Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Compact Quantum Dots for Single-molecule Imaging

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Construction of a High Resolution Microscope with Conventional and Holographic Optical Trapping Capabilities

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Real-Time DC-dynamic Biasing Method for Switching Time Improvement in Severely Underdamped Fringing-field Electrostatic MEMS Actuators

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Single Plane Illumination Module and Micro-capillary Approach for a Wide-field Microscope

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

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Fabrication of 3D Carbon Microelectromechanical Systems (C-MEMS)

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Demonstration of a Hyperlens-integrated Microscope and Super-resolution Imaging

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Design and Characterization Methodology for Efficient Wide Range Tunable MEMS Filters

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Intermediate Strain Rate Material Characterization with Digital Image Correlation

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