JoVE Logo

Sign In

National Institute of Standards and Technology

1 ARTICLES PUBLISHED IN JoVE

image

Engineering

Analysis of Contact Interfaces for Single GaN Nanowire Devices
Andrew M. Herrero 1, Paul T. Blanchard 1, Kris A. Bertness 1
1Quantum Electronics and Photonics Division, National Institute of Standards and Technology

A technique was developed that removes Ni/Au contact metal films from their substrate to allow for the examination and characterization of the contact/substrate and contact/NW interfaces of single GaN nanowire devices.

JoVE Logo

Privacy

Terms of Use

Policies

Research

Education

ABOUT JoVE

Copyright © 2024 MyJoVE Corporation. All rights reserved