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National Institute of Standards and Technology

1 ARTICLES PUBLISHED IN JoVE

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Engineering

Analysis of Contact Interfaces for Single GaN Nanowire Devices
Andrew M. Herrero 1, Paul T. Blanchard 1, Kris A. Bertness 1
1Quantum Electronics and Photonics Division, National Institute of Standards and Technology

A technique was developed that removes Ni/Au contact metal films from their substrate to allow for the examination and characterization of the contact/substrate and contact/NW interfaces of single GaN nanowire devices.

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