Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage AnalysisHéctor Pérez Ladrón de Guevara 1, Virginia Villa-Cruz 1, Rita Patakfalvi 1, Lily Xochilt Zelaya-Molina 2, Ramiro Muñiz-Diaz 1
1Centro Universitario de los Lagos, Universidad de Guadalajara, 2Centro Nacional de Recursos Genéticos, Instituto Nacional de Investigaciones Forestales, Agrícolas y Pecuarias
Here, we present the application of atomic force microscopy (AFM) as a simple and fast method for bacterial characterization and analyze details such as the bacterial size and shape, bacterial culture biofilms, and the activity of nanoparticles as bactericides.
