All
Research
Education
Onderzoek
Onderwijs
Business
Oplossingen
EN
EN - English
CN - 中文
DE - Deutsch
ES - Español
KR - 한국어
IT - Italiano
FR - Français
PT - Português
TR - Türkçe
JA - 日本語
PL - Polski
RU - Русский
HE - עִברִית
AR - العربية
Meld u aan
Michigan Center for Materials Characterization
15+ years experience operating scanning electron microscopes, focused ion beam microscopes, transmission electron microscopes, atom probe tomography, optical microscopy and sample preparation.
University of Michigan
Shreya Mahajan1,
Jonah A. Sharkins2,4,
Allen H. Hunter5,
Amir Avishai6,
Evon S. Ereifej2,3,4
1Department of Electrical Engineering and Computer Science, University of Michigan,
2, Veteran Affairs Ann Arbor Healthcare System,
3Department of Neurology, School of Medicine, University of Michigan,
4Department of Biomedical Engineering, University of Michigan,
5Michigan Center for Materials Characterization, University of Michigan,
6, Carl Zeiss SMT, Inc.
Privacy
Gebruiksvoorwaarden
Beleid
Neem contact met ons op.
Aanbevelen aan bibliotheek
JoVE Nieuwsbrieven
JoVE Journal
Methoden Collecties
JoVE Encyclopedia of Experiments
Archiveren
JoVE Core
JoVE Science Education
JoVE Lab Manual
JoVE Quiz
JoVE Playlist
Auteurs
Bibliothecarissen
Toegang
Over JoVE
JoVE Sitemap
Auteursrecht © 2025 MyJoVE Corporation. Alle rechten voorbehouden