JoVE Logo
Faculty Resource Center

Sign In

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

DOI :

10.3791/54030-v

July 12th, 2016

July 12th, 2016

9,239 Views

1Department of Physics, Central Michigan University

A method for electrochemically etching field emission tips is presented. Etching parameters are characterized and the operation of the tips in field emission mode is investigated.

-- Views

Related Videos

article

Fabrication of White Light-emitting Electrochemical Cells with Stable Emission from Exciplexes

article

Method for Recording Broadband High Resolution Emission Spectra of Laboratory Lightning Arcs (Video) | JoVE

article

Electric-field Control of Electronic States in WS2 Nanodevices by Electrolyte Gating (Video) | JoVE

article

One-Step Approach to Fabricating Polydimethylsiloxane Microfluidic Channels of Different Geometric Sections by Sequential Wet Etching Processes (Video) | JoVE

article

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope (Video) | JoVE

article

Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper (Video) | JoVE

article

Fabrication and Characterization of Thickness Mode Piezoelectric Devices for Atomization and Acoustofluidics (Video) | JoVE

article

Metal-Assisted Electrochemical Nanoimprinting of Porous and Solid Silicon Wafers (Video) | JoVE

article

UV-Vis Spectroscopic Characterization of Nanomaterials in Aqueous Media (Video) | JoVE

article

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy (Video) | JoVE

JoVE Logo

Privacy

Terms of Use

Policies

Research

Education

ABOUT JoVE

Copyright © 2024 MyJoVE Corporation. All rights reserved