JoVE Logo
Faculty Resource Center

Sign In

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

DOI :

10.3791/54030-v

July 12th, 2016

July 12th, 2016

9,200 Views

1Department of Physics, Central Michigan University

A method for electrochemically etching field emission tips is presented. Etching parameters are characterized and the operation of the tips in field emission mode is investigated.

-- Views

Related Videos

article

Fabrication of a Low-Cost, Fiber-Coupled, and Air-Spaced Fabry-Pérot Etalon

article

Microfluidic Channel-Based Soft Electrodes and Their Application in Capacitive Pressure Sensing

article

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

article

Author Spotlight: Advancements and Applications in Nanoparticle Synthesis Through Laser Ablation in Liquids

article

Advances in Nanoscale Infrared Spectroscopy to Explore Multiphase Polymeric Systems

article

Author Spotlight: Enhancing Fiber Composite Laminate Quality with the Wet Hand Lay-Up/Vacuum Bag Process

article

Real-Time Imaging of Bonding in 3D-Printed Layers

article

Author Spotlight: Revolutionizing Microfluidics Through Microchannel Fabrication on Nanopaper

article

Author Spotlight: Developing Cost-Effective and Customizable Balloon Tags for Fish Passage Studies

article

Author Spotlight: Design and Evaluation of Au-Electroplated Carbon Fiber Cloth Electrodes for Hydrogen Peroxide Fuel Cells

JoVE Logo

Privacy

Terms of Use

Policies

Research

Education

ABOUT JoVE

Copyright © 2024 MyJoVE Corporation. All rights reserved