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Materials Science Division
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Extinct technetium in silicon carbide stardust grains: implications for stellar nucleosynthesis.
Science (New York, N.Y.) Jan, 2004 | Pubmed ID: 14752154
Ion microscopy with resonant ionization mass spectrometry: time-of-flight depth profiling with improved isotopic precision.
European journal of mass spectrometry (Chichester, England) , 2010 | Pubmed ID: 20530842
High-resolution secondary ion mass spectrometry depth profiling of nanolayers.
Rapid communications in mass spectrometry : RCM Oct, 2012 | Pubmed ID: 22956313
Argonne National Laboratory
Sergey V. Baryshev1,
Robert A. Erck2,
Jerry F. Moore3,
Alexander V. Zinovev1,
C. Emil Tripa1,
Igor V. Veryovkin1
1Materials Science Division, Argonne National Laboratory,
2Energy Systems Division, Argonne National Laboratory,
3, MassThink LLC
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