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Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

9.2K Views

09:09 min

August 10th, 2019

DOI :

10.3791/59480-v

August 10th, 2019


Meer video's verkennen

SBF SEM

Hoofdstukken in deze video

0:04

Title

0:51

Sample Fixation and Processing for Electron Microscopy

3:51

Prepare Embedded Samples for Imaging

5:03

Imaging in the SBF-SEM (Serial Block Face Scanning Electron Microscopy) and Data Processing

6:22

Imaging in the FIB-SEM (Focused Ion Beam SEM)

7:49

Results: SBF-SEM and FIB-SEM Data

8:46

Conclusion

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