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09:09 min
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August 10th, 2019
DOI :
August 10th, 2019
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0:04
Title
0:51
Sample Fixation and Processing for Electron Microscopy
3:51
Prepare Embedded Samples for Imaging
5:03
Imaging in the SBF-SEM (Serial Block Face Scanning Electron Microscopy) and Data Processing
6:22
Imaging in the FIB-SEM (Focused Ion Beam SEM)
7:49
Results: SBF-SEM and FIB-SEM Data
8:46
Conclusion
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