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Scanning Electron Microscopic Evaluation of Surface Defects of Remover Retreatment File After Single and Multiple Uses

355 Views

03:07 min

October 11th, 2024

DOI :

10.3791/67329-v

October 11th, 2024


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Scanning Electron Microscopy

Rozdziały w tym wideo

0:00

Introduction

0:52

Retreatment Procedure for Remover Rotary Nickel-Titanium (NiTi) Files and Their Analysis

2:02

Representative Results

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