10.9K Views
•
07:50 min
•
July 17th, 2015
DOI :
July 17th, 2015
•0:05
Title
2:03
GaP/Si Sample Loading
2:51
Set up of Appropriate Working Conditions
3:46
Visualization of the Sample's Electron Channeling Patterns
4:35
Imaging of Defects and Features
6:13
Results: Imaging Clearly Shows the Misfit Networks in GaP/Si Samples
7:14
Conclusion
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