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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

7.6K Views

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05:57 min

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April 1st, 2020

DOI :

10.3791/60269-v

April 1st, 2020

•
7,623 Views

1University Grenoble Alpes and CEA, LETI, Minatec Campus

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SiN Integrated Optical Phased Arrays
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