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Implementation of a Reference Interferometer for Nanodetection

DOI :

10.3791/51133-v

April 26th, 2014

April 26th, 2014

9,155 Views

1Department of Electrical and Computer Engineering, University of Victoria

A reference interferometer technique, which is designed to remove undesirable laser jitter noise for nanodetection, is utilized for probing an ultra-high quality factor microcavity. Instructions for assembly, setup, and data acquisition are provided, alongside the measurement process for specifying the cavity quality factor.

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Reference Interferometer

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