JoVE Logo
Faculty Resource Center

Sign In

Picometer-Precision Atomic Position Tracking through Electron Microscopy

DOI :

10.3791/62164-v

15:04 min

July 3rd, 2021

July 3rd, 2021

5,198 Views

1Department of Materials Science & Engineering, The Pennsylvania State University, 2Center for Nanophase Materials Sciences, Oak Ridge National Laboratory

This work presents a workflow for atomic position tracking in atomic resolution transmission electron microscopy imaging. This workflow is performed using an open-source Matlab app (EASY-STEM).

Tags

Picometer precision

-- Views

Related Videos

article

Improved Heterojunction Quality in Cu2O-based Solar Cells Through the Optimization of Atmospheric Pressure Spatial Atomic Layer Deposited
Zn1-xMgxO

article

Characterizing Electron Transport through Living Biofilms

article

Liquid-cell Transmission Electron Microscopy for Tracking Self-assembly of Nanoparticles

article

Obtaining 3D Chemical Maps by Energy Filtered Transmission Electron Microscopy Tomography

article

Preparation of Graphene-Supported Microwell Liquid Cells for In Situ Transmission Electron Microscopy

article

Atomic Force Microscopy Combined with Infrared Spectroscopy as a Tool to Probe Single Bacterium Chemistry

article

Nanoparticle Tracking Analysis of Gold Nanoparticles in Aqueous Media through an Inter-Laboratory Comparison

article

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

article

Screening of Coatings for an All-Solid-State Battery Using In Situ Transmission Electron Microscopy

article

Tracking Electrochemistry on Single Nanoparticles with Surface-Enhanced Raman Scattering Spectroscopy and Microscopy

JoVE Logo

Privacy

Terms of Use

Policies

Research

Education

ABOUT JoVE

Copyright © 2024 MyJoVE Corporation. All rights reserved