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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

DOI :

10.3791/64102-v

12:18 min

June 27th, 2022

June 27th, 2022

1,871 Views

1Micron School of Materials Science & Engineering, Boise State University, 2Material, Physical, and Chemical Sciences Center, Sandia National Laboratories, 3Center for Advanced Energy Studies

Kelvin probe force microscopy (KPFM) measures surface topography and differences in surface potential, while scanning electron microscopy (SEM) and associated spectroscopies can elucidate surface morphology, composition, crystallinity, and crystallographic orientation. Accordingly, the co-localization of SEM with KPFM can provide insight into the effects of nanoscale composition and surface structure on corrosion.

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Kelvin Probe Force Microscopy

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