12.9K Views
•
10:53 min
•
July 30th, 2013
DOI :
July 30th, 2013
•Chapters in this video
0:05
Title
1:57
Microscope Setup, Preparation, and Mounting of the High Electron Mobility Transistor Circuit
6:37
Capacitance Mode Measurements
8:05
Results: Scanning Charge Accumulation and Capacitance-voltage Spectroscopy of Doped Semiconductors
10:17
Conclusion
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