Scanning-probe Single-electron Capacitance Spectroscopy

12.9K Views

10:53 min

July 30th, 2013

DOI :

10.3791/50676-v

July 30th, 2013


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Scanning probe

Chapters in this video

0:05

Title

1:57

Microscope Setup, Preparation, and Mounting of the High Electron Mobility Transistor Circuit

6:37

Capacitance Mode Measurements

8:05

Results: Scanning Charge Accumulation and Capacitance-voltage Spectroscopy of Doped Semiconductors

10:17

Conclusion

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