这项工作由JSPS KAKENHI，授权号JP16K17988和JP16K05996以及由内阁办公室经营的跨部门战略创新促进计划D66，结构材料创新测量与分析（SIP-IMASM）支持。作者也对Drs感激不尽。 NISSISISISISISHI和Kimiyoshi Naito的CFRP材料。

1.样品上的微/纳米级网格的确认<ol><li> 样品加工 <ol><li>将样品切割成在显微镜下使用的特定加载装置（ 例如， 1×5×30mm 3 ）所需的尺寸，使得观察到的表面比感兴趣区域大1.5倍。 </li><li>对待观察的样品表面进行抛光（ 例如， 1 x 30 mm 2 ），连续在自动抛光机上使用粗细砂纸（ 例如，使用SiC箔＃320 3分钟，然后在800 rpm下＃800进行1分钟和30 N）。每次抛光步骤后，用水清洗样品。 </li><li>抛光相同的样品表面，依次在自动抛光机上使用粗精细抛光溶液（ 例如，使用DP-Spray P 15μm，5 min，P 1μm，8 min，P 0.25μm，150 rpm，10 min; 30 N）。每次抛光后用水清洗样品g步。 </li></ol></li><li> 如果标本上没有定期图案，则制作微/纳米尺度网格 注意：如果样品表面上的微/纳米级上存在天然周期性图案，则可以省略此步骤。从以下选择栅极制造方法：紫外线（UV）或加热纳米压印光刻（NIL） 26 ，电子束光刻（EBL） 2和聚焦离子束（FIB）铣削6 。 注意：这里介绍了网格制作过程，以UV NIL为例。 <ol><li>使用移液管在样品表面上滴2 mL紫外线抗蚀剂。 </li><li>使用旋转涂布机以1500rpm将样品表面上的抗蚀剂涂覆60秒。 </li><li>在0.2MPa的压力下将纳米压印模压制成抗蚀剂层。将抗蚀剂用波长为375nm的UV曝光30秒。 </li><li>将纳米压印模具与样品表面分开。 </li></ol&gt; </li><li> 使用显微镜观察样本上的网格 <ol><li>使用离子涂布机（ 例如， 3Pa的涂覆30秒，溅射电流为30mA）在网格表面上涂覆厚度为3-10nm的铂或金层。 </li><li>将样品置于激光扫描显微镜（LSM） 23下 。 注意：也可以使用其他显微镜，例如透射电子显微镜（TEM） 5 ，原子力显微镜（AFM） 12或扫描电子显微镜（SEM） 7 。 </li><li>通过点击显微镜图像记录软件中的“捕获”和“文件|导出|图像文件”，使用显微镜调整焦点并保存一个网格图像。 </li></ol></li><li> 从网格图像计算样本的网格间距（nm或μm） <ol><li>计算超过10克的平均值在网格图像的中央区域的id间距，以避免扫描或镜头失真的潜在影响。 注意：样品上的网格可以在室温下保存几天。 </li></ol></li></ol> 2.在加载测试中获取网格图像<ol><li> 显微镜下加载试验的准备 <ol><li>在显微镜下将样品固定到加载装置，例如拉伸，压缩，加热或电加载装置。 注意：如果栅格间距小于20 nm，应使用TEM或AFM。如果网格间距为20nm〜10μm，则可以使用SEM。如果网格间距大于400nm，则可以使用LSM。 </li><li>根据具体要求设置负载速度（ 例如， 0.01 mm / s）和负载或位移增量步长（ 例如， 0.5 N /步或0.024 mm /步）。将负载和位移预设为零。 </li><li>使网格冲浪ace在观察平面。通过移动或旋转显微镜的样品台，在低倍率下选择感兴趣的区域。 </li><li>通过使图像中的网格间距大于1.8×1像素大小来选择适当的放大倍率。 注意：通常，最好使图像中的网格间距大于2像素。一个网格间距对应的像素越多，变形测量的精度越高，但测量的视场越小。 </li></ol></li><li> 加载测试中的网格图像集合 <ol><li>通过点击显微镜图像记录软件中的“捕获”和“文件|导出|图像文件”来保存加载区域的网格图像。 </li><li>开始使用加载装置的操作软件，通过施加第一加载步骤（ 例如， 0.5N或0.024mm）将样品原位载入显微镜。 </li><li>录音在显微镜的图像记录软件中单击“捕获”和“文件|导出|图像文件” ，在第一次加载步骤后（ 例如， 0.5 N或0.024 mm）处理感兴趣区域的网格图像。确保显微镜的放大倍数和工作距离保持不变。 </li><li>通过使用装载装置执行每个加载步骤继续加载样品。在每个加载步骤之后记录网格图像，直到样品断裂或直到达到某个值（ 例如，负载19次，并以0.5的间隔以1 N，1.5 N，2.0 N，...，10 N记录19个网格图像N;或0.048mm，0.072mm，0.096mm，...，0.48mm，间隔为0.024mm）。确保显微镜的放大倍数和工作距离保持不变。 注意：网格图像可以任意长时间保存。 </li></ol></li></ol> Def。之前和之后的采样莫尔条纹的生成ormation <ol><li> 网格图像中网格间距（像素）的估计 <ol><li>通过在图像处理软件（ 例如， Microsoft Paint）中测量两个相邻网格点的中心之间的距离，在加载前估算网格图像中的网格间距（单位：像素）。 </li><li>以最大负载估计网格图像中的网格间距。 </li></ol></li><li> 取样间距（像素）的确定 <ol><li>当变形前后的网格间距为1.8至2.5像素时，转到步骤3.2.2。当变形前后的网格间距在2.4和3.6像素之间时跳到步骤3.2.3。当变形前后的网格间距大于3.2像素时跳到步骤3.2.4。 </li><li>将采样间距设置为T = 2像素。跳到步骤3.3。 </li><li>将采样间距设置为T = 3像素。跳到步骤3.3。 </li><li>将采样间距T设置为正整数在0.75x和1.25x之间变形前后的网格间距，由丰富的模拟结果22确定 。 注意：如果有2个正整数满足步骤3.2.1和3.2.4中的要求，最好选择较大的整数作为采样间距。如果有3个或更多的正整数满足要求，最好选择中间整数，只要它比采样间距稍大一点。 </li></ol></li><li> 变形前产生采样莫尔条纹 <ol><li>变形前打开网格图像。假设x方向水平向右， y方向垂直向下，坐标（0,0）位于左上角，计算x方向的图像宽度W和y方向上的图像高度H 。 注意： y方向也可以定义为垂直向上</li><li>转到步骤3.3.3，在y方向产生莫尔条纹。跳到步骤3.3.7在x方向产生莫尔条纹。 </li><li>使用低通滤波器（LPF）将网格图像处理为光栅图像。例如，使用FT算法来抑制光栅，其主方向为x ，其中主方向被定义为垂直于光栅线的方向。将过滤器尺寸设置为接近网格间距。 </li><li>通过仅从几个水平线中提取灰度值，从y = k个像素（ k = 0）（ 图1 ）的采样间距T （T≥2）的间距（ 即仅保持灰色） y = k像素， y = k + T像素，...， y = k + iT像素的采样线中的值，其中i是po坐标整数）。使最后一个采样线的坐标k + iT小于图像高度H。 </li><li>通过用水平采样线执行图像的全场强度插值（线性或B样条），在y方向上生成采样波纹图案。 </li><li>通过在1像素的增量步长处改变k来重复步骤3.3.4和3.3.5 T -1次，从而在y方向上生成其他T -1采样莫尔图案（ 即，将变薄的起始点移动到y = k像素; k = 1，...， T -1）。 </li><li>在步骤3.3.3-3.3.6中使用与步骤3.3.3-3.3.6相同的步骤，通过在步骤3.3.3中将x改变为y来在x方向上生成T阶梯空间相移采样莫尔图案，将图像高度H更改为图像宽度W ，并在步骤3.3中将y更改为x 。4-3.3.6。 注意： x方向上的采样间距可能与y方向不同。 </li></ol></li><li> 变形后产生采样莫尔条纹 <ol><li>在不同的负载下打开所有网格图像。假设网格图像的数量为N。 </li><li>通过重复步骤3.3.3-3.3.6 N次，在y方向生成N组T阶空间相移莫尔条纹。 </li><li>通过重复步骤3.3.7 N次，在x方向生成N组T阶梯空间相移莫尔条纹。 </li></ol></li></ol>加载试验中样品的变形测量<ol><li> 变形前后莫尔条纹强度的确定 <ol><li>在t变形前提取T形波纹条纹的强度他的方向在步骤3.3.5和3.3.6;在步骤3.3.7中确定x方向上的莫尔强度。使用下列公式描述j （ j = x ， y ）方向变形前的T阶（T≥2）莫尔强度： <img alt="公式1" src="/files/ftp_upload/55739/image001.jpg" /> （1） 其中p j是在j （ j = x ， y ）方向变形之前的网格间距， A是调制幅度， D包括背景和较高频率强度。 </li><li>在步骤3.4.2中，在y方向上提取T形台阶莫尔条纹的强度，并在步骤3.4.3中确定x方向上的莫尔强度。描述变形后的T级 （T≥2）莫尔强度通过将I m， j （ k ）， p j ， A和D改变为I &#39;m，j （ k ）， p &#39; ，使用与上述相同的等式（等式1），在j （ j = x ， y ） j ， A &#39;和D &#39;，其中上标单引号意味着变形后。 注意：如果采样间距为T≥3像素，请忽略此步骤，然后跳至步骤4.3。 </li></ol></li><li><ol><li>从变形前的两步采样莫尔强度（ 图1a ）之间的乘积干涉重建多重莫尔条纹，使用以下等式23 <img alt="公式2" src="/files/ftp_upload/55739/image002.jpg" /> （2） 我在哪里， j代表强度of在变形前在j （ j = x ， y ）方向上重构的多重莫尔条纹。 </li><li>使用条纹定心技术24在变形前处理重建的多重莫尔条纹。为连续的整数和半整数f j = [1,1.5,2,2.5，...]分配给重建的叠加莫尔条纹中心线的边界。 注意：如果乘法莫尔条纹太密集，则可以首先确定两步采样莫尔条纹的边界（ 即，f j （ 0）= [1,0，2，0，3，0，...]和f j （1）= [0，1.5，0，2.5，0，3.5，...]）。乘法莫尔条纹的边缘顺序将为f j = f j （0）+ f j （1）= [1,1.5,2,2.5,3,3.5，...]。刚体位移不会影响应变结果。 </li><li>使用以下等式23测量变形前样品相对于采样间距的相对应变 <img alt="公式3" src="/files/ftp_upload/55739/image003.jpg" /> （3） <img alt="公式4" src="/files/ftp_upload/55739/image004.jpg" /> （4） 其中u j _rela和εj _rela分别表示在j （ j = x ， y ）方向变形之前样品的相对位移和相对应变，γxy _rela表示变形前的相对剪切应变。 </li><li>重复步骤4.2.1-4.2.3确定样品在x和y方向变形后的相对应变N次，改变I multi， j ， I m， j （0）， I m， j </在方程（2） - （4）中，对于I&#39;multi ， j ， I &#39;，（1）， p （ j ），（ j ）， j ， j ， m， j （0）， I &#39;m， j （1）， p&#39;j ， A &#39;， D &#39;， u&#39;j _rela （j = x，y）， ε&#39;j _rela和γ&#39;xy _上标单引号表示变形后。 </li><li>确定j （ j = x ， y ）方向上的实际正应变εj，其是网格间距和剪切应变的相对变化，γxy，这是绝对值e由变形前后相对应变载荷引起的试样网格角变化20 。 <img alt="公式5" src="/files/ftp_upload/55739/image005.jpg" /> （5） <img alt="方程式6" src="/files/ftp_upload/55739/image006.jpg" /> （6） </li></ol></li><li> 采样间距为T≥3像素时的变形测量 <ol><li>使用空间相移技术计算k = 0时变形前的j （ j = x ， y ）方向上的采样莫尔条纹的相位（ 图1b ） 21 <img alt="公式7" src="/files/ftp_upload/55739/image007.jpg" /> （7） </li><li>当k = 0时，通过代替φm获得变形后的j （ j = x ， y ）方向上的采样莫尔条纹的相位， <em&gt; j和I m， j （ k ）在等式（7）中分别为φ&#39;m ， j和I &#39;m， j （ k ），其中上标单引号表示变形后。对N个负载重复N次。 注意：如果在步骤4.3.1和4.3.2中的相位分​​布中存在太多的随机噪声，则可以使用sin / cos滤波器25来平滑相位。 </li><li>确定变形前后的j （ j = x ， y ）方向上的采样莫尔条纹的相位差（ 即 Δφm ， j =φ&#39;m ， j - φm ， j ）。 </li><li>测量位移u j ，正应变εj的分布<em&gt; j（ j = x ， y ）方向，由载荷引起的试样的剪切应变γxy。使用以下等式6,21 <img alt="公式8" src="/files/ftp_upload/55739/image008.jpg" /> （8） <img alt="公式9" src="/files/ftp_upload/55739/image009.jpg" /> （9） <img alt="方程式10" src="/files/ftp_upload/55739/image010.jpg" /> （10） 注意：如果应变分布中的噪声太大，可以使用平均滤光片，滤光片尺寸小于2个网格间距。 </li></ol></li><li> 结果存储 <ol><li>保存莫尔条纹，相位（采样间距为T≥3像素）的数据，图像形式的位移和应变，如.tif或.bmp文件和文本，如.txt或.csv文件。 </li></ol></li></ol>

<ol>
	<li>Weller, R., Shepard, B. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Displacement+measurement+by+mechanical+interferometry.">Displacement measurement by mechanical interferometry.</a> Proc. Soc. Exp. Stress Anal. 6 (1), 35-38 (1948).</li><li>Kishimoto, S., Egashira, M., Shinya, N. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Microcreep+deformation+measurements+by+a+moir&#233;+method+using+electron+beam+lithography+and+electron+beam+scan.">Microcreep deformation measurements by a moir&#233; method using electron beam lithography and electron beam scan.</a> Opt. Eng. 32 (3), 522-526 (1993).</li><li>Ifju, P., Han, B. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Recent+applications+of+moir&#233;+interferometry.">Recent applications of moir&#233; interferometry.</a> Exp. Mech. 50 (8), 1129-1147 (2010).</li><li>Zhang, H., Wu, C., Liu, Z., Xie, H. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=A+curved+surface+micro-moir&#233;+method+and+its+application+in+evaluating+curved+surface+residual+stress.">A curved surface micro-moir&#233; method and its application in evaluating curved surface residual stress.</a> Meas. Sci. Technol. 25 (9), 095002 (2014).</li><li>Zhang, H., Liu, Z., Wen, H., Xie, H., Liu, C. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Subset+geometric+phase+analysis+method+for+deformation+evaluation+of+HRTEM+images.">Subset geometric phase analysis method for deformation evaluation of HRTEM images.</a> Ultramicroscopy. 171, 34-42 (2016).</li><li>Wang, Q., Kishimoto, S., Xie, H., Liu, Z., Lou, X. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=In+situ+high+temperature+creep+deformation+of+micro-structure+with+metal+film+wire+on+flexible+membrane+using+geometric+phase+analysis.">In situ high temperature creep deformation of micro-structure with metal film wire on flexible membrane using geometric phase analysis.</a> Microelectron. Reliab. 53 (4), 652-657 (2013).</li><li>Wang, Q., Kishimoto, S. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Simultaneous+analysis+of+residual+stress+and+stress+intensity+factor+in+a+resist+after+UV-nanoimprint+lithography+based+on+electron+moir&#233;+fringes.">Simultaneous analysis of residual stress and stress intensity factor in a resist after UV-nanoimprint lithography based on electron moir&#233; fringes.</a> J. Micromech. Microeng. 22 (10), 105021 (2012).</li><li>Kishimoto, S., Wang, Q., Xie, H., Zhao, Y. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Study+of+the+surface+structure+of+butterfly+wings+using+the+scanning+electron+microscopic+moir&#233;+method.">Study of the surface structure of butterfly wings using the scanning electron microscopic moir&#233; method.</a> Appl. Opt. 46 (28), 7026-7034 (2007).</li><li>Li, C., Liu, Z., Xie, H., Wu, D. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Novel+3D+SEM+Moir&#233;+method+for+micro+height+measurement.">Novel 3D SEM Moir&#233; method for micro height measurement.</a> Opt. Express. 21 (13), 15734-15746 (2013).</li><li>Xie, H., Wang, Q., Kishimoto, S., Dai, F. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Characterization+of+planar+periodic+structure+using+inverse+laser+scanning+confocal+microscopy+moir&#233;+method+and+its+application+in+the+structure+of+butterfly+wing.">Characterization of planar periodic structure using inverse laser scanning confocal microscopy moir&#233; method and its application in the structure of butterfly wing.</a> J. Appl. Phys. 101 (10), 103511 (2007).</li><li>Tang, M., Xie, H., Wang, Q., Zhu, J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Phase-shifting+laser+scanning+confocal+microscopy+moir&#233;+method+and+its+applications.">Phase-shifting laser scanning confocal microscopy moir&#233; method and its applications.</a> Meas. Sci. Technol. 21 (5), 055110 (2010).</li><li>Xie, H., Kishimoto, S., Asundi, A., Boay, C. G., Shinya, N., Yu, J., Ngoi, B. K. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=In-plane+deformation+measurement+using+the+atomic+force+microscope+moir&#233;+method.">In-plane deformation measurement using the atomic force microscope moir&#233; method.</a> Nanotechnology. 11 (1), 24 (2000).</li><li>Xie, H., Liu, Z., Fang, D., Dai, F., Gao, H., Zhao, Y. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=A+study+on+the+digital+nano-moir&#233;+method+and+its+phase+shifting+technique.">A study on the digital nano-moir&#233; method and its phase shifting technique.</a> Meas. Sci. Technol. 15 (9), 1716 (2004).</li><li>Wang, Q., Kishimoto, S., Yamauchi, Y. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Three-directional+structural+characterization+of+hexagonal+packed+nanoparticles+by+hexagonal+digital+moir&#233;+method.">Three-directional structural characterization of hexagonal packed nanoparticles by hexagonal digital moir&#233; method.</a> Opt. Lett. 37 (4), 548-550 (2012).</li><li>Liu, Z., Lou, X., Gao, J. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Deformation+analysis+of+MEMS+structures+by+modified+digital+moir&#233;+methods.">Deformation analysis of MEMS structures by modified digital moir&#233; methods.</a> Opt. Lasers Eng. 48 (11), 1067-1075 (2010).</li><li>Li, Y., Xie, H., Chen, P., Zhang, Q. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Theoretical+analysis+of+moir&#233;+fringe+multiplication+under+a+scanning+electron+microscope.">Theoretical analysis of moir&#233; fringe multiplication under a scanning electron microscope.</a> Meas. Sci. Technol. 22 (2), 025301 (2010).</li><li>Patorski, K., Wielgus, M., Ekielski, M., Ka&#378;mierczak, P. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=AFM+nanomoir&#233;+technique+with+phase+multiplication.">AFM nanomoir&#233; technique with phase multiplication.</a> Meas. Sci. Technol. 24 (3), 035402 (2013).</li><li>Wang, Q., Ri, S., Takashita, Y., Ogihara, S., Yoshida, S. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Chapter+33:+Full-field+measurements+of+principal+strains+and+orientations+using+moir&#233;+fringes.">Chapter 33: Full-field measurements of principal strains and orientations using moir&#233; fringes.</a> Advancement of Optical Methods in Experimental Mechanics. 3, 251-259 (2017).</li><li>Wang, Z., Han, B. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Advanced+iterative+algorithm+for+phase+extraction+of+randomly+phase-shifted+interferograms.">Advanced iterative algorithm for phase extraction of randomly phase-shifted interferograms.</a> Opt. Lett. 29 (14), 1671-1673 (2004).</li><li>Wang, Q., Xie, H., Hu, Z., Zhang, J., Sun, J., Liu, G. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Residual+thermo-creep+deformation+of+copper+interconnects+by+phase-shifting+SEM+moir&#233;+method.">Residual thermo-creep deformation of copper interconnects by phase-shifting SEM moir&#233; method.</a> Appl. Mech. Mater. 83, 185-190 (2011).</li><li>Ri, S., Fujigaki, M., Morimoto, Y. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Sampling+moir&#233;+method+for+accurate+small+deformation+distribution+measurement.">Sampling moir&#233; method for accurate small deformation distribution measurement.</a> Exp. Mech. 50 (4), 501-508 (2010).</li><li>Ri, S., Muramatsu, T. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Theoretical+error+analysis+of+the+sampling+moir&#233;+method+and+phase+compensation+methodology+for+single-shot+phase+analysis.">Theoretical error analysis of the sampling moir&#233; method and phase compensation methodology for single-shot phase analysis.</a> Appl. Opt. 51 (16), 3214-3223 (2012).</li><li>Wang, Q., Ri, S., Tsuda, H. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Digital+sampling+Moir&#233;+as+a+substitute+for+microscope+scanning+Moir&#233;+for+high-sensitivity+and+full-field+deformation+measurement+at+micron/nano+scales.">Digital sampling Moir&#233; as a substitute for microscope scanning Moir&#233; for high-sensitivity and full-field deformation measurement at micron/nano scales.</a> Appl. Opt. 55 (25), 6858-6865 (2016).</li><li>Dai, F., Wang, Z. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Automatic+fringe+patterns+analysis+using+digital+processing+tehniques:+I+fringe+center+method.">Automatic fringe patterns analysis using digital processing tehniques: I fringe center method.</a> Acta Photonica Sinica. 28, 700-706 (1999).</li><li>Gutmann, B., Weber, H. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Phase-shifter+calibration+and+error+detection+in+phase-shifting+applications:+a+new+method.">Phase-shifter calibration and error detection in phase-shifting applications: a new method.</a> Appl. Opt. 37 (32), 7624-7631 (1998).</li><li>Wang, Q., Kishimoto, S., Tanaka, Y., Kagawa, Y. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Micro/submicro+grating+fabrication+on+metals+for+deformation+measurement+based+on+ultraviolet+nanoimprint+lithography.">Micro/submicro grating fabrication on metals for deformation measurement based on ultraviolet nanoimprint lithography.</a> Opt. Lasers Eng. 51 (7), 944-948 (2013).</li><li>Min-Jin, T., Hui-Min, X., Yan-Jie, L., Xiao-Jun, L., Dan, W. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=A+new+grating+fabrication+technique+on+metal+films+using+UV-nanoimprint+lithography.">A new grating fabrication technique on metal films using UV-nanoimprint lithography.</a> Chin. Phys. Lett. 29 (9), 098101 (2012).</li></ol>

作者没有什么可以披露的。

在所描述的技术中，如果样品上没有周期性图案，则一个具有挑战性的步骤是微/纳米尺度网格或光栅（缩写为格栅）制造26 。变形前网格间距应均匀，因为它是变形测量的重要参数。如果材料是金属，金属合金或陶瓷，UV或加热纳米压印光刻（NIL） 27 ，电子束光刻（EBL） 2 ，聚焦离子束（FIB）铣削6或网格重复法<sup class="xref"...

微/纳米尺度变形测量对于评估先进材料的机械性能，不稳定行为，残余应力和裂纹发生至关重要。由于光学技术是非接触的，全场的和非破坏性的，所以已经开发了用于近几十年的变形测量​​的各种光学方法。近年来，微纳米尺度变形测量技术主要包括莫尔方法1,2,3,4 ，几何相位分析（GPA） 5,6 ，傅里叶变换（FT），数字图像相关（DIC）和电子散斑图案干涉测量（ESPI）。在这些技术中，由于存在多个频率，所以GPA和FT不太适用于复杂的变形测量​​。 DIC方法是sim因为变形载体是随机斑点，而是无噪声。最后，ESPI对振动非常敏感。 在微/纳米级莫尔方法中，目前最常用的方法是显微镜扫描莫尔法，例如电子扫描莫尔7,8,9 ，激光扫描莫尔10,11和原子力显微镜（AFM）莫尔12 ，以及一些基于显微镜的莫尔方法，例如数字/重叠莫尔13,14,15方法和乘法/分数莫尔法16,17 。扫描莫尔法具有广泛的视野，高分辨率等诸多优点并且对随机噪声不敏感。然而，传统的扫描莫尔法对于2D应变测量是不方便的，因为需要将样品台或扫描方向旋转90°并扫描两次以在两个方向18上产生莫尔条纹。旋转和双重扫描过程引入旋转误差并花费很长时间，严重影响2D应变的测量精度，特别是对于剪切应变。虽然时间相移技术19,20可以提高变形测量精度，但是它需要时间和特殊的相移装置不适于动态测试。 采样莫尔法21,22在位移测量中具有高精度，并且现在主要用于当汽车p屁股。为了将采样莫尔法扩展到微尺度/纳米尺度的2D应变测量，从2像素采样莫尔条纹开始，新开发了一种重新构成的多重波纹法，其中测量是灵敏度的两倍，保持扫描波纹法。此外，空间相移采样莫尔法也是从多像素采样莫尔条纹开发的，允许进行高精度应变测量。该协议将介绍详细的应变测量程序，并有望帮助研究人员和工程师学习如何测量变形，改进材料和产品的制造过程。

<table border="0" cellpadding="0" cellspacing="0" width="737">
	<tbody>
		<tr height="21">
			<td height="21" style="height:21px;width:208px;">Automatic Polishing Machine</td>
			<td style="width:161px;">Marumoto Struers K.K.</td>
			<td style="width:201px;">LaboPol-30, Labor Force-100</td>
			<td style="width:167px;"></td>
		</tr>
		<tr height="34">
			<td height="34" style="height:34px;width:208px;">Carbon Fiber Reinforced Plastic</td>
			<td style="width:161px;">Mitsubishi Plastics, Inc.&#160;</td>
			<td style="width:201px;">HYEJ16M95DHX1</td>
			<td style="width:167px;"></td>
		</tr>
		<tr height="85">
			<td height="85" style="height:85px;width:208px;">Computer</td>
			<td style="width:161px;">DELL Japan</td>
			<td style="width:201px;">VOSTRO</td>
			<td style="width:167px;">Can be replaced with another computer with C++ programming language</td>
		</tr>
		<tr height="43">
			<td height="43" style="height:43px;width:208px;">Image Recording Software</td>
			<td style="width:161px;">Lasertec Corporation</td>
			<td style="width:201px;">LMEYE7</td>
			<td style="width:167px;">Installed in a laser scanning microscope</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:208px;">Ion Coater</td>
			<td style="width:161px;">Japan Electron Optics Laboratory Ltd.</td>
			<td style="width:201px;">JEC3000F</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:208px;">Laser Scanning Microscope</td>
			<td style="width:161px;">Lasertec Corporation</td>
			<td style="width:201px;">OPTELICS HYBRID</td>
			<td></td>
		</tr>
		<tr height="90">
			<td height="90" style="height:90px;width:208px;">Nanoimprint Device</td>
			<td style="width:161px;">Japan Laser Corporation&#160;</td>
			<td style="width:201px;">EUN-4200</td>
			<td style="width:167px;">Can be replaced with a electron beam lithography device or a focused ion beam milling device</td>
		</tr>
		<tr height="90">
			<td height="90" style="height:90px;width:208px;">Nanoimprint Mold</td>
			<td style="width:161px;">SCIVAX Corporation</td>
			<td style="width:201px;">3.0&#956;m pitch</td>
			<td style="width:167px;">Customized</td>
		</tr>
		<tr height="90">
			<td height="90" style="height:90px;width:208px;">Nanoimprint Resist</td>
			<td style="width:161px;">Toyo Gosei Co., Ltd&#160;</td>
			<td style="width:201px;">PAK01</td>
			<td style="width:167px;"></td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:208px;">Polishing Solution</td>
			<td style="width:161px;">Marumoto Struers K.K.</td>
			<td style="width:201px;">DP-Spray P 15&#956;m, 1&#956;m, 0.25&#956;m</td>
			<td>Use from coarse to fine</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:208px;">Pipet</td>
			<td style="width:161px;">AS ONE Corporation</td>
			<td style="width:201px;">10mL</td>
			<td></td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:208px;">Sand Paper</td>
			<td style="width:161px;">Marumoto Struers K.K.</td>
			<td style="width:201px;">SiC Foil #320, #800</td>
			<td>Use from coarse to fine</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:208px;">Spin Coater</td>
			<td>MIKASA Corporation</td>
			<td style="width:201px;">MS-A100</td>
			<td></td>
		</tr>
	</tbody>
</table>

micro/nano-scale strain distribution measurement from sampling moir&#233; fringes

这项工作描述了全场微/纳米尺度变形测量的采样莫尔技术的测量程序和原理。开发的技术可以通过两种方式进行：使用重建的多重莫尔法或空间相移采样莫尔法。当样本网格间距约为2像素时，产生2像素采样莫尔条纹以重建用于变形测量的乘法云纹图案。位移和应变灵敏度都是在同一广视野范围内的传统扫描波纹法的两倍。当样本网格间距大于或大于3像素时，产生多像素采样莫尔条纹，并组合空间相移技术进行全场变形测量。应变测量精度得到显着提高，并且易于实现自动批量测量。两种方法都可以像传统的莫尔技术一样，测量来自单点格栅图像的二维（2D）应变分布，而不旋转样品或扫描线。作为示例，在三点弯曲试验中测量了二维位移和应变分布，包括两个碳纤维增强塑料样品的剪切应变。所提出的技术预计将在各种材料的机械性能，裂纹发生和残余应力的非破坏性定量评估中发挥重要作用。

根据莫尔形成原理23和测量过程（ 图1 ）测量两种碳纤维增强塑料（CFRP）样品（＃1和＃2）的二维位移和应变分布。 CFRP样品由10-11μm直径的K13D碳纤维和环氧树脂制成。使用来自两步采样莫尔条纹的重建的叠加莫尔法确定CFRP＃1的变形，并且使用来自三步采样莫尔条纹的空间相移采样莫尔法测量CFRP＃2的变形。 <p class="jove_step" fo:kee...

Watch this Scientific Journal Video about Micro/Nano-scale Strain Distribution Measurement from Sampling MoirÃ© Fringes at JoVE.com

Micro/Nano-scale Strain Distribution Measurement from Sampling Moir&amp;#233; Fringes

这里介绍了采用2像素和多像素采样方法进行微/纳米级高精度应变分布测量的采样莫尔技术。

微米/纳米尺度应变分布测量从采样莫尔条纹

This work describes the measurement procedure and principles of a sampling moir&#233; technique for full-field micro/nano-scale deformation measurements. ...

The overall goal of this experiment is to accurately measure the strain distributions of materials at the micro or nano scale using the two-pixel or multi-pixel sampling moir

micronano-scale-strain-distribution-measurement-from-sampling-moir

Research

JoVE Journal

Engineering

Micro/Nano-scale Strain Distribution Measurement from Sampling Moir&#233; Fringes

12.2K 次观看.  National Institute of Advanced Industrial Science and Technology (AIST). The overall goal of this experiment is to accurately measure the strain distributions of materials at the micro or nano scale using the two-pixel or multi-pixel sampling moir

视频: Micro/Nano-scale Strain Distribution Measurement from Sampling Moir&#233; Fringes

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle

Plasmonics, which are based on the collective oscillation of electrons due to light excitation, involve strongly enhanced local electric fields and thus have potential applications in nonlinear optics, which requires extraordinary optical intensity. One of the most studied nonlinearities in plasmonics is nonlinear absorption, including saturation and reverse saturation behaviors. Although scattering and absorption in nanoparticles are closely correlated by the Mie theory, there has been no report of nonlinearities in plasmonic scattering until very recently. 
Last year, not only saturation, but also reverse saturation of scattering in an isolated plasmonic particle was demonstrated for the first time. The results showed that saturable scattering exhibits clear wavelength dependence, which seems to be directly linked to the localized surface plasmon resonance (LSPR). Combined with the intensity-dependent measurements, the results suggest the possibility of a common mechanism underlying the nonlinear behaviors of scattering and absorption. These nonlinearities of scattering from a single gold nanosphere (GNS) are widely applicable, including in super-resolution microscopy and optical switches. 
In this paper, it is described in detail how to measure nonlinearity of scattering in a single GNP and how to employ the super-resolution technique to enhance the optical imaging resolution based on saturable scattering. This discovery features the first super-resolution microscopy based on nonlinear scattering, which is a novel non-bleaching contrast method that can achieve a resolution as low as l/8 and will potentially be useful in biomedicine and material studies.

Saturable and reverse saturable scattering were discovered in isolated plasmonic particles and adopted as a novel non-bleaching contrast method in super-resolution microscopy. Here the experimental procedures of detecting and extracting nonlinear scattering are explained in detail, as well as how to enhance resolution with the aid of saturated excitation microscopy.

从单电浆纳米粒子散射非线性测量

Plasmonics, which are based on the collective oscillation of electrons due to light excitation, involve strongly enhanced local electric fields and thus ...

科研

工程学

Strain Sensing Based on Multiscale Composite Materials Reinforced with Graphene Nanoplatelets

The electrical response of NH2-functionalized graphene nanoplatelets composite materials under strain was studied. Two different manufacturing methods are proposed to create the electrical network in this work: (a) the incorporation of the nanoplatelets into the epoxy matrix and (b) the coating of the glass fabric with a sizing filled with the same nanoplatelets. Both types of multiscale composite materials, with an in-plane electrical conductivity of ~10-3 S/m, showed an exponential growth of the electrical resistance as the strain increases due to distancing between adjacent functionalized graphene nanoplatelets and contact loss between overlying ones. The sensitivity of the materials analyzed during this research, using the described procedures, has been shown to be higher than commercially available strain gauges. The proposed procedures for self-sensing of the structural composite material would facilitate the structural health monitoring of components in difficult to access emplacements such as offshore wind power farms. Although the sensitivity of the multiscale composite materials was considerably higher than the sensitivity of metallic foils used as strain gauges, the value reached with NH2 functionalized graphene nanoplatelets coated fabrics was nearly an order of magnitude superior. This result elucidated their potential to be used as smart fabrics to monitor human movements such as bending of fingers or knees. By using the proposed method, the smart fabric could immediately detect the bending and recover instantly. This fact permits precise monitoring of the time of bending as well as the degree of bending.

The integration of conductive nanoparticles, such as graphene nanoplatelets, into glass fiber composite materials creates an intrinsic electrical network susceptible to strain. Here, different methods to obtain strain sensors based on the addition of graphene nanoplatelets into the epoxy matrix or as a coating on glass fabrics are proposed.

基于多尺度复合材料的增强与石墨烯纳米片应变传感

The electrical response of NH2-functionalized graphene nanoplatelets composite materials under strain was studied. Two different manufacturing methods are ...

Optical Trap Loading of Dielectric Microparticles In Air

We demonstrate a method to trap a selected dielectric microparticle in air using radiation pressure from a single-beam gradient optical trap. Randomly scattered dielectric microparticles adhered to a glass substrate are momentarily detached using ultrasonic vibrations generated by a piezoelectric transducer (PZT). Then, the optical beam focused on a selected particle lifts it up to the optical trap while the vibrationally excited microparticles fall back to the substrate. A particle may be trapped at the nominal focus of the trapping beam or at a position above the focus (referred to here as the levitation position) where gravity provides the restoring force. After the measurement, the trapped particle can be placed at a desired position on the substrate in a controlled manner. 
In this protocol, an experimental procedure for selective optical trap loading in air is outlined. First, the experimental setup is briefly introduced. Second, the design and fabrication of a PZT holder and a sample enclosure are illustrated in detail. The optical trap loading of a selected microparticle is then demonstrated with step-by-step instructions including sample preparation, launching into the trap, and use of electrostatic force to excite particle motion in the trap and measure charge. Finally, we present recorded particle trajectories of Brownian and ballistic motions of a trapped microparticle in air. These trajectories can be used to measure stiffness or to verify optical alignment through time domain and frequency domain analysis. Selective trap loading enables optical tweezers to track a particle and its changes over repeated trap loadings in a reversible manner, thereby enabling studies of particle-surface interaction.

A protocol for launching and stably trapping selected dielectric microparticles in air is presented.

介电微粒的光阱装载在空气中

We demonstrate a method to trap a selected dielectric microparticle in air using radiation pressure from a single-beam gradient optical trap. Randomly ...

Standardized Method for Measuring Collection Efficiency from Wipe-sampling of Trace Explosives

One of the limiting steps to detecting traces of explosives at screening venues is effective collection of the sample. Wipe-sampling is the most common procedure for collecting traces of explosives, and standardized measurements of collection efficiency are needed to evaluate and optimize sampling protocols. The approach described here is designed to provide this measurement infrastructure, and controls most of the factors known to be relevant to wipe-sampling. Three critical factors (the applied force, travel distance, and travel speed) are controlled using an automated device. Test surfaces are chosen based on similarity to the screening environment, and the wipes can be made from any material considered for use in wipe-sampling. Particle samples of the explosive 1,3,5-trinitroperhydro-1,3,5-triazine (RDX) are applied in a fixed location on the surface using a dry-transfer technique. The particle samples, recently developed to simulate residues made after handling explosives, are produced by inkjet printing of RDX solutions onto polytetrafluoroethylene (PTFE) substrates. Collection efficiency is measured by extracting collected explosive from the wipe, and then related to critical sampling factors and the selection of wipe material and test surface. These measurements are meant to guide the development of sampling protocols at screening venues, where speed and throughput are primary considerations.

Optimized sampling protocols and the development of new wipe materials can be facilitated by standardized measurements of collection efficiency from wipe-sampling. Our approach for sampling trace explosives uses an automated device to control speed, force, and distance during wipe-sampling followed by extraction of collected explosives.

从微量炸药的擦拭取样测量收集效率的标准化方法

One of the limiting steps to detecting traces of explosives at screening venues is effective collection of the sample. Wipe-sampling is the most common ...

Generation of Size-controlled Poly (ethylene Glycol) Diacrylate Droplets via Semi-3-Dimensional Flow Focusing Microfluidic Devices

Uniform and size-controllable poly (ethylene glycol) diacrylate (PEGDA) droplets could be produced via the flow focusing process in a microfluidic device. This paper proposes a semi-three-dimensional (semi-3D) flow-focusing microfluidic chip for droplet formation. The polydimethylsiloxane (PDMS) chip was fabricated using the multi-layer soft lithography method. Hexadecane containing surfactant was used as the continuous phase, and PEGDA with the ultraviolet (UV) photo-initiator was the dispersed phase. Surfactants allowed the local surface tension to drop and formed a more cusped tip which promoted breaking into tiny micro-droplets. As the pressure of dispersed phase was constant, the size of droplets became smaller with increasing continuous phase pressure before dispersed phase flow was broken off. As a result, droplets with size variation from 1 &#181;m to 80 &#181;m in diameter could be selectively achieved by changing the pressure ratio in two inlet channels, and the average coefficient of variation was estimated to be below 7%. Furthermore, droplets could turn into micro-beads by UV exposure for photo-polymerization. Conjugating biomolecules on such micro-beads surface have many potential applications in the fields of biology and chemistry.

Generation of Size-controlled Poly ethylene Glycol Diacrylate Droplets via Semi-3-Dimensional Flow Focusing Microfluidic Devices

Here, we present a protocol to illustrate the fabrication processes and verifying experiments of a semi-three-dimensional (semi-3D) flow-focusing microfluidic chip for droplet formation.

Semi-3-Dimensional 流聚焦微流控装置产生尺寸控制的聚乙二醇二丙烯酸酯液滴

Uniform and size-controllable poly (ethylene glycol) diacrylate (PEGDA) droplets could be produced via the flow focusing process in a microfluidic device. ...

Cutting Procedures, Tensile Testing, and Ageing of Flexible Unidirectional Composite Laminates

Many body armor designs incorporate unidirectional (UD) laminates. UD laminates are constructed of thin (&#60;0.05 mm) layers of high-performance yarns, where the yarns in each layer are oriented parallel to each other and held in place using binder resins and thin polymer films. The armor is constructed by stacking the unidirectional layers in different orientations. To date, only very preliminary work has been performed to characterize the ageing of the binder resins used in unidirectional laminates and the effects on their performance. For example, during the development of the conditioning protocol used in the National Institute of Justice Standard-0101.06, UD laminates showed visual signs of delamination and reductions in V50, which is the velocity at which half of the projectiles are expected to perforate the armor, after ageing. A better understanding of the material property changes in UD laminates is necessary to comprehend the long-term performance of armors constructed from these materials. There are no current standards recommended for mechanically interrogating unidirectional (UD) laminate materials. This study explores methods and best practices for accurately testing the mechanical properties of these materials and proposes a new test methodology for these materials. Best practices for ageing these materials are also described.

The goal of the study was to develop protocols to prepare consistent specimens for accurate mechanical testing of high-strength aramid or ultra-high-molar-mass polyethylene-based flexible unidirectional composite laminate materials and to describe protocols for performing artificial ageing on these materials.

柔性单向复合层压板的切割程序、拉伸测试和老化

Many body armor designs incorporate unidirectional (UD) laminates. UD laminates are constructed of thin (&#60;0.05 mm) layers of high-performance yarns, ...

Intermediate Strain Rate Material Characterization with Digital Image Correlation

The mechanical response of a material under dynamic load is typically different than its behavior under static conditions; therefore, the common quasistatic equipment and procedures used for material characterization are not applicable for materials under dynamic loads. The dynamic response of a material depends on its deformation rate and is broadly categorized into high (i.e., greater than 200/s), intermediate (i.e., 10&#8722;200/s) and low strain rate regimes (i.e., below 10/s). Each of these regimes calls for specific facilities and testing protocols to ensure the reliability of the acquired data. Due to the limited access to high-speed servo-hydraulic facilities and validated testing protocols, there is a noticeable gap in the results at the intermediate strain rate. The current manuscript presents a validated protocol for the characterization of different materials at these intermediate strain rates. Strain gauge instrumentation and digital image correlation protocols are also included as complimentary modules to extract the utmost level of detailed data from every single test. Examples of raw data, obtained from a variety of materials and test setups (e.g., tensile and shear) is presented and the analysis procedure used to process the output data is described. Finally, the challenges of dynamic characterization using the current protocol, along with the limitations of the facility and methods of overcoming potential problems are discussed.

Here we present a methodology for the dynamic characterization of tensile specimens at intermediate strain rates using a high-speed servo-hydraulic load frame. Procedures for strain gauge instrumentation and analysis, as well as for digital image correlation strain measurements on the specimens, are also defined.

数字图像相关的中间应变率材料表征

The mechanical response of a material under dynamic load is typically different than its behavior under static conditions; therefore, the common ...

Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper

The current analytical techniques for characterizing printing and graphic arts substrates are largely ex situ and destructive. This limits the amount of data that can be obtained from an individual sample and renders it difficult to produce statistically relevant data for unique and rare materials. Resonant cavity dielectric spectroscopy is a non-destructive, contactless technique which can simultaneously interrogate both sides of a sheeted material and provide measurements which are suitable for statistical interpretations. This offers analysts the ability to quickly discriminate between sheeted materials based on composition and storage history. In this methodology article, we demonstrate how contactless resonant cavity dielectric spectroscopy may be used to differentiate between paper analytes of varying fiber species compositions, to determine the relative age of the paper, and to detect and quantify the amount of post-consumer waste (PCW) recycled fiber content in manufactured office paper.

A protocol for the non-destructive analysis of the fiber content and relative age of paper.

纤维素纸非接触式共振腔电谱研究的方法研究

The current analytical techniques for characterizing printing and graphic arts substrates are largely ex situ and destructive. This limits the amount of ...

Measuring Sub-23 Nanometer Real Driving Particle Number Emissions Using the Portable DownToTen Sampling System

The current particle size threshold of the European Particle Number (PN) emission standards is 23 nm. This threshold could change because future combustion engine vehicle technology may emit large amounts of sub-23 nm particles. The Horizon 2020 funded project DownToTen (DTT) developed a sampling and measurement method to characterize particle emissions in this currently unregulated size range. A PN measurement system was developed based on an extensive review of the literature and laboratory experiments testing a variety of PN measurement and sampling approaches. The measurement system developed is characterized by high particle penetration and versatility, which enables the assessment of primary particles, delayed primary particles, and secondary aerosols, starting from a few nanometers in diameter. This paper provides instruction on how to install and operate this Portable Emission Measurement System (PEMS) for Real Drive Emissions (RDE) measurements and assess particle number emissions below the current legislative limit of 23 nm.

Presented here is the DownToTen (DTT) portable emission measurement system to assess real driving automotive emissions of sub-23 nm particles.

使用便携式 DownToTen 采样系统测量低于 23 纳米实际驱动粒子数排放

The current particle size threshold of the European Particle Number (PN) emission standards is 23 nm. This threshold could change because future ...

Calibration Procedures for Orthogonal Superposition Rheology

Orthogonal superposition (OSP) rheology is an advanced rheological technique that involves superimposing a small-amplitude oscillatory shear deformation orthogonal to a primary shear flow. This technique allows the measurement of structural dynamics of complex fluids under non-linear flow conditions, which is important for the understanding and prediction of the performance of a wide range of complex fluids. The OSP rheological technique has a long history of development since the 1960s, mainly through the custom-built devices that highlighted the power of this technique. The OSP technique is now commercially available to the rheology community. Given the complicated design of the OSP geometry and the non-ideal flow field, users should understand the magnitude and sources of measurement error. This study presents calibration procedures using Newtonian fluids that includes recommendations for best practices to reduce measurement errors. Specifically, detailed information on the end-effect factor determination method, sample filling procedure, and identification of the appropriate measurement range (e.g., shear rate, frequency, etc.) are provided.

We present a detailed calibration protocol for a commercial orthogonal superposition rheology technique using Newtonian fluids including end-effect correction factor determination methods and recommendations for best practices to reduce experimental error.

正交叠加流变学校准程序

Orthogonal superposition (OSP) rheology is an advanced rheological technique that involves superimposing a small-amplitude oscillatory shear deformation ...