Device Testing: Thermal Camera Test for Embedded Heaters
6:27
Device Testing: Calibrating LDV and Test Setup
9:19
Device Testing: Testing 68μm Long MEMS Filters via LDV
10:32
Device Testing: Higher Mode Measurement
11:01
Avoiding Device Failures
11:45
Avoiding Failures: High Thermal Stress and Burning
12:10
Boosting The Tuning Capability
13:16
Results
14:07
Conclusion
Transcript
Filters are very popular and widely used in receiver and transmitter sequence in wireless communication. In addition, gas sensors, biosensors and temperature sensors are the most popular application. These high demanding filters should be fabricat
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A protocol for a fixed-fixed beam design using a laser Doppler vibrometer (LDV), including the measurement of frequency tuning, modification of tuning capability, and avoidance of device failure and stiction, is presented. The superiority of the LDV method over the network analyzer is demonstrated due to its higher mode capability.
