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Data Acquisition Protocol for Determining Embedded Sensitivity Functions

6.0K Views

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07:46 min

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April 20th, 2016

DOI :

10.3791/53690-v

April 20th, 2016

•

6,000 Views

Janette J. Meyer¹, Douglas E. Adams¹, Janene Silvers²

¹Laboratory for Systems Integrity and Reliability (LASIR), Vanderbilt University, ²Mechanical Engineering, Purdue University

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Zusammenfassung

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