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Chih-Pong Huang

Metallurgy Section,
Materials & Electro-Optics Research Division,
Metallurgy Section, Materials & Electro-Optics Research Division

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PUBLICATIONS

Investigation of fullerene embedded silicon surfaces with scanning probe microscopy.

Journal of nanoscience and nanotechnology Nov, 2010 | Pubmed ID: 21137884

INSTITUTIONS

National Chung-Shan Institute of Science and Technology

JOVE ARTICLES

Mon-Shu Ho¹,

Chih-Pong Huang²,

Jyun-Hwei Tsai³,

Che-Fu Chou¹,

Wen-Jay Lee³

¹Department of Physics and Institute of Nanoscience, National Chung Hsing University,

²Metallurgy Section, Materials & Electro-Optics Research Division, National Chung-Shan Institute of Science and Technology,

³, National Center for High-Performance Computing

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