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Probing C₈₄-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

11.6K Views

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13:58 min

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September 28th, 2016

DOI :

10.3791/54235-v

September 28th, 2016

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11,594 Views

Mon-Shu Ho¹, Chih-Pong Huang², Jyun-Hwei Tsai³, Che-Fu Chou¹, Wen-Jay Lee³

¹Department of Physics and Institute of Nanoscience, National Chung Hsing University, ²Metallurgy Section, Materials & Electro-Optics Research Division, National Chung-Shan Institute of Science and Technology, ³National Center for High-Performance Computing

Capitoli

Trascrizione

Riepilogo

Esplora Altri Video

C84 embedded Si Substrate

Scanning Probe Microscopy

Molecular Dynamics

Silicon 111 Substrate

Electronic Properties

Optoelectronic Properties

Mechanical Properties

Magnetic Properties

Field Emission Properties

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