Scanning SQUID Study of Vortex Manipulation by Local Contact

Scanning-probe Single-electron Capacitance Spectroscopy

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Analysis of Contact Interfaces for Single GaN Nanowire Devices

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Monolayer Contact Doping of Silicon Surfaces and Nanowires Using Organophosphorus Compounds

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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

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Hand Controlled Manipulation of Single Molecules via a Scanning Probe Microscope with a 3D Virtual Reality Interface

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Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography

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Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy

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Measurements of Soil Carbon by Neutron-Gamma Analysis in Static and Scanning Modes

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