MPN은 금융 지원에 대한 감독 십 프로그램에 감사드립니다. MPN은 태양 전지 처리를위한 프로토콜의 개발과 관련하여 도움이 유 친 Tseng 감사하려고합니다. 이 작품은 Nanoscale 재료 센터, 에너지의 미국학과, 과학의 사무실, 계약 번호 DE-AC02-06CH11357에 따라 기본 에너지 과학 사용자 시설의 사무실에서 수행되었다.

1. 신호 수집 <ol class="lalpha"><li> Nanoscope-V 컨트롤러가 장착 된 상용 멀티 모드 AFM (Veeco, 산타 바바라, CA)에 샘플을 (PC 61 BM) : PSS/P3HT 음극이없는 폴리머 태양 전지 (ITO / PEDOT)을 설치합니다. </li><li> 멀티 AFM 프로브 홀더에 전도성 AFM 프로브를 설치합니다. </li><li> AFM 프로브, 샘플 및 전압 소스 사이의 전기적 연결을 만듭니다. </li><li> 루트 전류 증폭기 출력 (전류 신호), 다중 모드 AFM 편향 출력 (힘 신호), 디지털 수집 카드에 멀티 AFM 샘플 높이 출력 (거리 신호) (NI-PCI-6115 DAQ). 펨토의 이득 DLPCA-200 현재 앰프 50 kHz에서 대역폭 1 NA / V입니다. </li><li> AFM 프로브 및 ITO 전극 사이에 6V 편견을 적용합니다. </li><li> 지형 신호를 수집 PeakForceTM 모드에서 다중 모드 AFM을 실행합니다 : 30 NN, 300 nm의 지원 진동 진폭, 2 kHz에서의 지원 진동 주파수, 1 Hz의 스캔 속도, 그리고 resoluti의 최대 힘 세트 포인트512 픽셀 512의 있습니다. </li><li> 동시에 지형 신호의 취득 (단계 전자)와 LabView / MATLAB 제어에 의해 섹션 D에 나와있는 신호를 수집합니다. </li></ol> 2. 데이터 분석 1 단계 : 끌어 오기 오프 포스의 생성, 연락처 강성, 그리고 현재지도 <ol class="lalpha"><li> MATLAB에 시간이 날인 된 전류, 힘과 거리 신호를 읽어 보시기 바랍니다. </li><li> 거리, 힘 - - 첫 번째 스캔 라인에 대한 현재 곡선 2000 힘을 만듭니다. 곡선의 수 지원 진동 주파수와 스캔 율의 기능입니다. </li><li> 각 힘에서 - 거리 곡선 결정 강성에 연락하여 AFM 프로브 (그림 1)의 철회 동안 오프 - 힘을 당긴다. </li><li> 각 힘에서 - AFM 프로브는 (그림 1)을 철회하는 동안 표면과 접촉하는 동안 현재의 곡선, 평균 전류를 결정합니다. </li><li> 보간 2,000 동등하게 이격 된 연락처 강성, 풀 - 오프 - 힘, 그리고 resolu 일치하는 512 점의 현재 포인트지형 신호의 기. 연락처 강성, 풀 - 오프 - 힘, 그리고 현재의지도에 대한 첫 번째 스캔 라인이 이루어집니다. </li><li> 전자 512 번 단계 b를 반복하여 강성, 풀 - 오프 - 힘, 그리고 현재의지도에 문의 만듭니다. 결과는 그림 2에 표시됩니다. </li></ol> 3. 데이터 분석 2 단계 : 연락처 - 지역 아티팩트의 제거 <ol class="lalpha"><li> 방정식 (1)를 사용하여 (2) Young의 계수 (E 재료) 및 재료의 저항 (ρ) 스캔의 각 지점에서 얻을 수 : 20 <img alt="수식 1" fo:content-width="2.853in" fo:src="/files/ftp_upload/50293/50293eq1highres.jpg" src="/files/ftp_upload/50293/50293eq1.jpg" /> 사용 F ADH = F 당겨 - 8 NN (AFM과 표면 사이의 물이 초승달 모양으로 인해 접착력), 20 연락처 강성 (K) 및 전류 (I)지도, 프로빙 전압 (V), 필름 두께 (L) 등을 부착에너지 (W = γ 프로브 + γ 물질의 L - γ 프로브 - 재료, 어디서 γ 프로브 - 프로브 물질의 표면 에너지, γ 재료 - 표면 샘플 물질의 에너지, 그리고 γ 프로브 - 재료 - 샘플 자료와 프로브 물질의 계면 에너지) . 20 </li></ol>

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관심 없음 충돌이 선언 없습니다.

유기 태양 광 전력 변환 효율의 최근 획기적인 (PCE) (OPV) 세포 (세포 수준에서 10 %를 밀어) 높은 처리량 및 낮은 비용으로 제조 공정 4 준수와 콘서트에서 3으로 OPV 기술에 스포트라이트를 가져왔다 대형 면적 태양 전지의 저렴한 제조 도전에 대해 가능한 솔루션입니다. OPV 자료 나노 미터 스케일에서 본질적으로 inhomogeneous입니다. OPV 자료와 태양 광 장치의 성능 Nanoscale inhomogeneity은 밀접한 연결되어 있습니다. 따라서, 구성뿐만 아니라 OPV 재료의 전기적 특성의 이해 inhomogeneity 앞으로 OPV 기술을 이동 파라마운트 중요합니다. 원자 힘 현미경 (AFM)은 1986 년부터 표면 지형의 고해상도 측정을위한 도구로 개발되었습니다. 현재 5, 재료 속성 (Young의 계수, 6-10 일 함수, 11 행위에 대해 기술ivity, 12 electromechanics, 13-15 등) 측정이 증가하고 관심을 받고있다. OPV 재료의 경우, 지역 위상 구성과 전기적 특성의 상관 관계가 유기 태양 전지의 내부 동작의 이해를 공개에 대한 약속을 보유하고 있습니다. 1 16-17 AFM 기반 기법 저작자 표시 팔뿐만 아니라 고해상도 단계의 가능하다 등의 고분자 재료에 매핑 전기적 특성. 따라서, 원칙적으로 폴리머 위상 성분 (기계적 측정을 통해) 18 및 전기 속성의 상관 관계는 AFM 기반의 기술을 사용하여 가능합니다. 재료의 기계적 전기적 특성 측정을위한 많은 AFM 기반 기술은 AFM 프로브와 표면 사이의 접촉의 일정한 지역의 가정을 사용합니다. 이러한 가정은 종종 표면 지형 및 기계적 / 전기적 특성 간의 강한 상관 관계에 결과를하는 실패합니다. 최근에, 새로운 AFM 기반 기술기계적 성질 (PeakForce) 19의 높은 처리량 측정이 도입되었습니다. PeakForce 참치는 (PeakForce 방법의 변화) 샘플의 기계적 전기적 특성의 동시 측정을위한 플랫폼을 제공합니다. 그러나, PeakForce 참치 방법은 일반적으로 강력하게 때문에 측정시 연락 걸렸다는 다양성의 상관 아르 기계 및 전기 재산지도를 생산하고 있습니다. 이 논문에서, 우리는 AFM을 사용하여 기계적 및 전기적 특성의 정확한 측정을 유지하면서 접촉 반경을 변화와 관련된 상관 관계를 제거하기위한 실험 프로토콜을 제시한다. 자료 &#39;저항과 영의 계수의 정량적 측정에 프로토콜 결과의 구현입니다.

<table border="1"><tbody><tr><td> 시약 / 재료의 이름 </td><td> 회사 </td><td> 카탈로그 번호 </td><td> 코멘트 </td></tr><tr><td> Plextronics 잉크 </td><td> Plexcore </td><td> PV 1000 </td><td></td></tr><tr><td> ITO 코팅 유리 기판 </td><td> 델타 기술, Inc의 </td><td></td><td> 25 옴 / 평방 </td></tr><tr><td> 30 MHz의 함수 발생기 합성 </td><td> Stanfor 연구 시스템 </td><td> DS345 </td><td></td></tr><tr><td> 현재 증폭기 </td><td> 펨토 </td><td> DLPCA-200 </td><td></td></tr><tr><td> 멀티 AFM </td><td> Veeco, 산타 바바라, CA </td><td></td><td> Nanoscope-V 컨트롤러 장착 </td></tr><tr><td> DAQ 카드 </td><td> 내쇼날 인스트루먼트 </td><td> NI-PCI-6115 </td><td></td></tr><tr><td> 금속 PT 프로브 </td><td> RMNano </td><td> 12Pt3008 </td><td></td></tr><tr><td> MATLAB 소프트웨어 </td><td> Mathworks </td><td></td><td></td></tr><tr><td> LabView 소프트웨어 </td><td> 내쇼날 인스트루먼트 </td><td></td><td></td></tr></tbody></table>

concurrent quantitative conductivity and mechanical properties measurements of organic photovoltaic materials using afm

유기 태양 광 (OPV) 재료는 나노 미터 스케일에서 본질적으로 inhomogeneous입니다. OPV 재료의 Nanoscale inhomogeneity는 태양 광 디바이스의 성능에 영향을 미칩니다. 따라서, 구성뿐만 아니라 OPV 재료의 전기적 특성의 공간적 변화에 대한 이해를하는 것이 앞으로 PV 기술을 이동 파라마운트 중요합니다.이 글에서 1,2가, 우리는 서브와 OPV 재료의 전기 및 기계적 성질의 양적 측정을위한 프로토콜을 설명 -100 nm의 해상도를 제공합니다. 현재, 재료 특성 측정은 일반적으로 만 질적 정보를 제공 상용 AFM 기반 기술 (PeakForce, 전도성 AFM)를 사용하여 수행했습니다. 저항뿐만 아니라 Young의 계수는 원형 ITO / PEDOT에 우리의 방법을 사용하여 측정의 값 : PSS/P3HT : PC 61 BM 시스템은 문학 데이터와 잘 일치합니다. P3HT는 : PC 61 BM의 조화는 BM-풍부하고 P3HT 풍부한 PC 61로 분리 domaiNS. PC 61 BM-풍부하고 P3HT 풍부한 도메인의 기계적 성질은 필름의 표면에 도메인 속성을 허용하는 다릅니다. 중요한 것은, 기계 및 전기 데이터를 결합하여 필름의 두께를 측정 전기적 특성 변화와 필름의 표면에 도메인 구조의 상관 관계 할 수 있습니다.

측정의 영의 계수와 저항지도 (그림 3) 현재 전형적인 결과는 위에서 설명한. ITO / PEDOT의 기계 및 전기 속성 : PSS/P3HT : PC 61 BM 스택은 부정적인 (-10 V), 긍정적 (6 V) AFM 프로브에 적용 전압에서 측정되었다. AFM 탐침과 샘플 사이의 정전 상호 작용과 관련된 이미징 유물은 AFM을 사용하여 기능적 특성의 정량적 측정을위한 일반적인 문제입니다. 다른 전압에서 측정 영의 moduli의 크기...

Watch this Scientific Journal Video about Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM at JoVE.com

Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM

유기 태양 광 (OPV) 재료는 나노 미터 스케일에서 본질적으로 inhomogeneous입니다. OPV 재료의 Nanoscale inhomogeneity는 태양 광 디바이스의 성능에 영향을 미칩니다. 이 논문에서, 우리는 하위-100 나노 미터 해상도 OPV 재료의 전기 및 기계적 성질의 양적 측정을위한 프로토콜을 설명합니다.

동시 수량 전도성과 AFM을 사용하여 유기 태양 광 재료의 기계적 성질 측정

Organic photovoltaic  (OPV) materials are inherently inhomogeneous at the nanometer scale. Nanoscale  inhomogeneity of OPV materials affects performance ...

concurrent-quantitative-conductivity-mechanical-properties

Research

JoVE Journal

Engineering

11.6K 조회수.  Argonne National Laboratory. 유기 태양 광 (OPV) 재료는 나노 미터 스케일에서 본질적으로 inhomogeneous입니다. OPV 재료의 Nanoscale inhomogeneity는 태양 광 디바이스의 성능에 영향을 미칩니다. 이 논문에서, 우리는 하위-100 나노 미터 해상도 OPV 재료의 전기 및 기계적 성질의 양적 측정을위한 프로토콜을 설명합니다.

비디오: Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM

Using Neutron Spin Echo Resolved Grazing Incidence Scattering to Investigate Organic Solar Cell Materials

The spin echo resolved grazing incidence scattering (SERGIS) technique has been used to probe the length-scales associated with irregularly shaped crystallites. Neutrons are passed through two well defined regions of magnetic field; one before and one after the sample. The two magnetic field regions have opposite polarity and are tuned such that neutrons travelling through both regions, without being perturbed, will undergo the same number of precessions in opposing directions. In this case the neutron precession in the second arm is said to &#34;echo&#34; the first, and the original polarization of the beam is preserved. If the neutron interacts with a sample and scatters elastically the path through the second arm is not the same as the first and the original polarization is not recovered. Depolarization of the neutron beam is a highly sensitive probe at very small angles (&#60;50&#160;&#956;rad) but still allows a high intensity, divergent beam to be used. The decrease in polarization of the beam reflected from the sample as compared to that from the reference sample can be directly related to structure within the sample.
In comparison to scattering observed in neutron reflection measurements the SERGIS signals are often weak and are unlikely to be observed if the in-plane structures within the sample under investigation are dilute, disordered, small in size and polydisperse or the neutron scattering contrast is low. Therefore, good results will most likely be obtained using the SERGIS technique if the sample being measured consist of thin films on a flat substrate and contain scattering features that contains a high density of moderately sized features (30 nm to 5 &#181;m) which scatter neutrons strongly or the features are arranged on a lattice. An advantage of the SERGIS technique is that it can probe structures in the plane of the sample.

Progress has been made in utilizing spin echo resolved grazing incidence scattering (SERGIS) as a neutron scattering technique to probe the length-scales in irregular samples. Crystallites of [6,6]-phenyl-C61-butyric acid methyl ester have been probed using the SERGIS technique and the results confirmed by optical and atomic force microscopy.

중성자 스핀 에코 사용 하 여 방목 발생률 을 해결 하는 유기 태양 전지 물질을 조사 하기 위해

The spin echo resolved grazing incidence scattering (SERGIS) technique has been used to probe the length-scales associated with irregularly shaped ...

연구

공학

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Atomic force microscopy (AFM) uses a pyramidal tip attached to a cantilever to probe the force response of a surface. The deflections of the tip can be measured to ~10 pN by a laser and sectored detector, which can be converted to image topography. Amplitude modulation or &#8220;tapping mode&#8221; AFM involves the probe making intermittent contact with the surface while oscillating at its resonant frequency to produce an image. Used in conjunction with a fluid cell, tapping-mode AFM enables the imaging of biological macromolecules such as proteins in physiologically relevant conditions. Tapping-mode AFM requires manual tuning of the probe and frequent adjustments of a multitude of scanning parameters which can be challenging for inexperienced users. To obtain high-quality images, these adjustments are the most time consuming.
PeakForce Quantitative Nanomechanical Property Mapping (PF-QNM) produces an image by measuring a force response curve for every point of contact with the sample. With ScanAsyst software, PF-QNM can be automated. This software adjusts the set-point, drive frequency, scan rate, gains, and other important scanning parameters automatically for a given sample. Not only does this process protect both fragile probes and samples, it significantly reduces the time required to obtain high resolution images. PF-QNM is compatible for AFM imaging in fluid; therefore, it has extensive application for imaging biologically relevant materials.
The method presented in this paper describes the application of PF-QNM to obtain images of a bacterial red-light photoreceptor, RpBphP3 (P3), from photosynthetic R. palustris in its light-adapted state. Using this method, individual protein dimers of P3 and aggregates of dimers have been observed on a mica surface in the presence of an imaging buffer. With appropriate adjustments to surface and/or solution concentration, this method may be generally applied to other biologically relevant macromolecules and soft materials.

A method for investigating the structure of a protein photoreceptor using atomic force microscopy (AFM) is described in this paper. PeakForce Quantitative Nanomechanical Property Mapping (PF-QNM) reveals intact protein dimers on a mica surface.

PeakForce 양적 나노 기계 대지 매핑을 사용하여 붉은 빛이 광수의 원자 힘 현미경

Atomic force microscopy (AFM) uses a pyramidal tip attached to a cantilever to probe the force response of a surface. The deflections of the tip can be ...

Measuring the Mechanical Properties of Living Cells Using Atomic Force Microscopy

Mechanical properties of cells and extracellular matrix (ECM) play important roles in many biological processes including stem cell differentiation, tumor formation, and wound healing. Changes in stiffness of cells and ECM are often signs of changes in cell physiology or diseases in tissues. Hence, cell stiffness is an index to evaluate the status of cell cultures. Among the multitude of methods applied to measure the stiffness of cells and tissues, micro-indentation using an Atomic Force Microscope (AFM) provides a way to reliably measure the stiffness of living cells. This method has been widely applied to characterize the micro-scale stiffness for a variety of materials ranging from metal surfaces to soft biological tissues and cells. The basic principle of this method is to indent a cell with an AFM tip of selected geometry and measure the applied force from the bending of the AFM cantilever. Fitting the force-indentation curve to the Hertz model for the corresponding tip geometry can give quantitative measurements of material stiffness. This paper demonstrates the procedure to characterize the stiffness of living cells using AFM. Key steps including the process of AFM calibration, force-curve acquisition, and data analysis using a MATLAB routine are demonstrated. Limitations of this method are also discussed.

This paper demonstrates a protocol to characterize the mechanical properties of living cells by means of microindentation using an Atomic Force Microscope (AFM).

원자 힘 현미경을 사용하여 살아있는 세포의 기계적 특성을 측정

Mechanical  properties of cells and extracellular matrix (ECM) play important roles in many  biological processes including stem cell differentiation, ...

생체공학

Quantitative Hardness Measurement by Instrumented AFM-indentation

In this work, a combination of amplitude-modulated non-contact atomic force microscopy and atomic force spectroscopy is applied for instrumented hardness measurements on an Au(111) surface with atomistic resolution of single plasticity events. A careful experimental procedure is described that includes the force sensor selection, its calibration, the calibration of the cantilever deflection detection system, and the minimization of instrumental drift for accurate and reproducible force-distance measurements. Also, a method for the data analysis is presented that allows the extraction of force-penetration curves from recorded force-distance curves. A typical curve displays a clear elastic deformation regime up to the first plasticity event, or pop-in, with a length in the range of one to two Burger's vectors. Later plasticity events exhibit the same magnitude. The work of plasticity is further extracted from the measurements. Finally, the hardness is determined in combination with the indentation curve using non-contact atomic force microscopy images of the remaining indents.

This experimental protocol describes how atomic force microscopy can be used to measure hardness at the true nanometer scale and to detect single atomistic plasticity events.

계장 AFM-들여 쓰기에 의해 정량 경도 측정

In this work, a combination of amplitude-modulated non-contact atomic force microscopy and atomic force spectroscopy is applied for instrumented hardness ...

Use of Atomic Force Microscopy to Measure Mechanical Properties and Turgor Pressure of Plant Cells and Plant Tissues

We present here the use of atomic force microscopy to indent plant tissues and recover its mechanical properties. Using two different microscopes in indentation mode, we show how to measure an elastic modulus and use it to evaluate cell wall mechanical properties. In addition, we also explain how to evaluate turgor pressure. The main advantages of atomic force microscopy are that it is non-invasive, relatively rapid (5~20 min), and that virtually any type of living plant tissue that is superficially flat can be analyzed without the need for treatment. The resolution can be very good, depending on the tip size and on the number of measurements per unit area. One limitation of this method is that it only gives direct access to the superficial cell layer.

Here, we present atomic force microscopy (AFM), operated as a nano- and micro-indentation tool on cells and tissues. The instrument allows the simultaneous acquisition of 3D surface topography of the sample and its mechanical properties, including cell wall Young's modulus as well as turgor pressure.

식물 세포 및 식물 조직의 기계적 특성 및 터거 압력을 측정하기 위해 원자력 현미경 검사법 사용

We present here the use of atomic force microscopy to indent plant tissues and recover its mechanical properties. Using two different microscopes in ...

발생학

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Atomic force microscopy (AFM)-based single molecule force spectroscopy is an ideal tool for investigating the interactions between a single polymer and surfaces. For a true single molecule experiment, covalent attachment of the probe molecule is essential because only then can hundreds of force-extension traces with one and the same single molecule be obtained. Many traces are in turn necessary to prove that a single molecule alone is probed. Additionally, passivation is crucial for preventing unwanted interactions between the single probe molecule and the AFM cantilever tip as well as between the AFM cantilever tip and the underlying surface. The functionalization protocol presented here is reliable and can easily be applied to a variety of polymers. Characteristic single molecule events (i.e., stretches and plateaus) are detected in the force-extension traces. From these events, physical parameters such as stretching force, desorption force and desorption length can be obtained. This is particularly important for the precise investigation of stimuli-responsive systems at the single molecule level. As exemplary systems poly(ethylene glycol) (PEG), poly(N-isopropylacrylamide) (PNiPAM) and polystyrene (PS) are stretched and desorbed from SiOx (for PEG and PNiPAM) and from hydrophobic self-assembled monolayer surfaces (for PS) in aqueous environment.

Covalent attachment of probe molecules to atomic force microscopy (AFM) cantilever tips is an essential technique for the investigation of their physical properties. This allows us to determine the stretching force, desorption force and length of polymers via AFM-based single molecule force spectroscopy with high reproducibility.

AFM 기반 힘 분광학을 위한 단일 분자의 공유 부착

Atomic force microscopy (AFM)-based single molecule force spectroscopy is an ideal tool for investigating the interactions between a single polymer and ...

화학

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Scanning electrochemical microscopy (SECM) is used to measure the local electrochemical behavior of liquid/solid, liquid/gas and liquid/liquid interfaces. Atomic force microscopy (AFM) is a versatile tool to characterize micro- and nanostructure in terms of topography and mechanical properties. However, conventional SECM or AFM provides limited laterally resolved information on electrical or electrochemical properties at nanoscale. For instance, the activity of a nanomaterial surface at crystal facet levels is difficult to resolve by conventional electrochemistry methods. This paper reports the application of a combination of AFM and SECM, namely, AFM-SECM, to probe nanoscale surface electrochemical activity while acquiring high-resolution topographical data. Such measurements are critical to understanding the relationship between nanostructure and reaction activity, which is relevant to a wide range of applications in material science, life science and chemical processes. The versatility of the combined AFM-SECM is demonstrated by mapping topographical and electrochemical properties of faceted nanoparticles (NPs) and nanobubbles (NBs), respectively. Compared to previously reported SECM imaging of nanostructures, this AFM-SECM enables quantitative assessment of local surface activity or reactivity with higher resolution of surface mapping.

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope AFM-SECM

Atomic force microscopy (AFM) combined with scanning electrochemical microscopy (SECM), namely, AFM-SECM, can be used to simultaneously acquire high-resolution topographical and electrochemical information on material surfaces at nanoscale. Such information is critical to understanding heterogeneous properties (e.g., reactivity, defects, and reaction sites) on local surfaces of nanomaterials, electrodes and biomaterials.

하이브리드 원자력 현미경 -스캐닝 전기 화학 현미경 (AFM-SECM)을 사용하여 나노 물질의 표면 전기 화학 활성을 조사

Scanning electrochemical microscopy (SECM) is used to measure the local electrochemical behavior of liquid/solid, liquid/gas and liquid/liquid interfaces. ...

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

An atomic force microscope (AFM) fundamentally measures the interaction between a nanoscale AFM probe tip and the sample surface. If the force applied by the probe tip and its contact area with the sample can be quantified, it is possible to determine the nanoscale mechanical properties (e.g., elastic or Young&#39;s modulus) of the surface being probed. A detailed procedure for performing quantitative AFM cantilever-based nanoindentation experiments is provided here, with representative examples of how the technique can be applied to determine the elastic moduli of a wide variety of sample types, ranging from kPa to GPa. These include live mesenchymal stem cells (MSCs) and nuclei in physiological buffer, resin-embedded dehydrated loblolly pine cross-sections, and Bakken shales of varying composition.
Additionally, AFM cantilever-based nanoindentation is used to probe the rupture strength (i.e., breakthrough force) of phospholipid bilayers. Important practical considerations such as method choice and development, probe selection and calibration, region of interest identification, sample heterogeneity, feature size and aspect ratio, tip wear, surface roughness, and data analysis and measurement statistics are discussed to aid proper implementation of the technique. Finally, co-localization of AFM-derived nanomechanical maps with electron microscopy techniques that provide additional information regarding elemental composition is demonstrated.

Quantifying the contact area and force applied by an atomic force microscope (AFM) probe tip to a sample surface enables nanoscale mechanical property determination. Best practices to implement AFM cantilever-based nanoindentation in air or fluid on soft and hard samples to measure elastic modulus or other nanomechanical properties are discussed.

An atomic force microscope (AFM) fundamentally measures the interaction between a nanoscale AFM probe tip and the sample surface. If the force applied by ...

AFMS의 병렬 활성 캔틸레버 어레이를 통해 고처리량 검사 가능

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

An Atomic Force Microscope&#160;(AFM) is&#160;a powerful and versatile tool for nanoscale surface studies to capture 3D topography images of samples. However, due to their limited imaging throughput, AFMs have not been widely adopted for large-scale inspection purposes. Researchers have developed high-speed AFM systems to record dynamic process videos in chemical and biological reactions at tens of frames per second, at the cost of a small imaging area of up to several square micrometers. In contrast, inspecting large-scale nanofabricated structures, such as semiconductor wafers, requires nanoscale spatial resolution imaging of a static sample over hundreds of square centimeters with high productivity. Conventional AFMs use a single passive cantilever probe with an optical beam deflection system, which can only collect one pixel at a time during AFM imaging, resulting in low imaging throughput. This work utilizes an array of active cantilevers with embedded piezoresistive sensors and thermomechanical actuators, which allows simultaneous multi-cantilever operation in parallel operation for increased imaging throughput. When combined with large-range nano-positioners and proper control algorithms, each cantilever can be individually controlled to capture multiple AFM images. With data-driven post-processing algorithms, the images can be stitched together, and defect detection can be performed by comparing them to the desired geometry. This paper introduces principles of the custom AFM using the active cantilever arrays, followed by a discussion on practical experiment considerations for inspection applications. Selected example images of silicon calibration grating, highly-oriented pyrolytic graphite, and extreme ultraviolet lithography masks are captured using an array of four active cantilevers (&#34;Quattro&#34;) with a 125 &#181;m tip separation distance. With more engineering integration, this high-throughput, large-scale imaging tool can provide 3D metrological data for extreme ultraviolet (EUV) masks, chemical mechanical planarization (CMP) inspection, failure analysis, displays, thin-film step measurements, roughness measurement dies, and laser-engraved dry gas seal grooves.

저자 스포트라이트: Quattro-Parallel Cantilever Arrays를 사용한 Active Probe Atomic Force Microscopy 소개

Large-scale sample inspection with nanoscale resolution has a wide range of applications, especially for nanofabricated semiconductor wafers. Atomic force microscopes can be a great tool for this purpose, but are limited by their imaging speed. This work utilizes parallel active cantilever arrays in AFMs to enable high-throughput and large-scale inspections.

고처리량 대규모 시료 검사를 위한 Quattro-Parallel Cantilever 어레이를 사용한 Active Probe Atomic Force Microscopy

An Atomic Force Microscope&#160;(AFM) is&#160;a powerful and versatile tool for nanoscale surface studies to capture 3D topography images of samples. ...

동시 수량 전도성과 AFM을 사용하여 유기 태양 광 재료의 기계적 성질 측정

요약

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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

고처리량 대규모 시료 검사를 위한 Quattro-Parallel Cantilever 어레이를 사용한 Active Probe Atomic Force Microscopy

고처리량 대규모 시료 검사를 위한 Quattro-Parallel Cantilever 어레이를 사용한 Active Probe Atomic Force Microscopy